NTMS4107NR2G ON Semiconductor, NTMS4107NR2G Datasheet
NTMS4107NR2G
Specifications of NTMS4107NR2G
NTMS4107NR2GOSTR
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NTMS4107NR2G Summary of contents
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... IPCN 16091 Copper Wire replacing Gold Wire in the SO8, TSOP6, ChipFET Packages for MOSFET Products issued 31 Jan 2008. ON Semiconductor is notifying customers of its use of Copper Wire (in place of Gold Wire) on their MOSFET Products in the SO8 Package. Products assembled with our Trench1 MOSFET Die, and co-packaged SO8 products assembled with a Schottky Die will be affected ...
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Update Notification #16265 Reliability Data Summary: SO8 Device: NTMS4177PR2G Test: High Temperature Reverse Bias (HTRB) Conditions: Ta=150'C, Vds= 80% BVdss Rating, Duration : 1008-Hrs, 3-Lots Results: 0/240 Test: High Temperature Gate Bias (HTGB) Conditions: Ta=150'C, Vds= 100% Vgs Rating, Duration ...
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... Update Notification #16265 AFFECTED DEVICE LIST NTMS4107NR2G NTMS4176PR2G NTMS4177PR2G NTMS4873NFR2G NTMSD2P102LR2G NTMSD2P102R2SG NTMSD2P102R2 NTMSD3P102R2G NTMSD3P102R2SG NTMSD3P102R2 NTMD4184PFR2G NTMD4884NFR2G Issue Date: 12 May 2009 Rev.07-02-06 Page ...