AD7538JRZ Analog Devices Inc, AD7538JRZ Datasheet - Page 8
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AD7538JRZ
Manufacturer Part Number
AD7538JRZ
Description
DAC 1-CH R-2R 14-Bit 24-Pin SOIC W
Manufacturer
Analog Devices Inc
Datasheet
1.AD7538JRZ-REEL.pdf
(16 pages)
Specifications of AD7538JRZ
Package
24SOIC W
Resolution
14 Bit
Conversion Rate
667 KSPS
Architecture
R-2R
Digital Interface Type
Parallel
Number Of Outputs Per Chip
1
Output Type
Current
Full Scale Error
±8 LSB
Integral Nonlinearity Error
±2 LSB
Maximum Settling Time
1.5 us
Settling Time
1.5µs
Number Of Bits
14
Data Interface
Parallel
Number Of Converters
1
Voltage Supply Source
Single Supply
Power Dissipation (max)
1W
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
24-SOIC (7.5mm Width)
Number Of Channels
1
Interface Type
Parallel
Single Supply Voltage (typ)
12/15V
Dual Supply Voltage (typ)
Not RequiredV
Power Supply Requirement
Single
Single Supply Voltage (min)
11.4V
Single Supply Voltage (max)
15.75V
Dual Supply Voltage (min)
Not RequiredV
Dual Supply Voltage (max)
Not RequiredV
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
24
Package Type
SOIC W
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AD7538JRZ
Manufacturer:
ADI/亚德诺
Quantity:
20 000
AD7538
TERMINOLOGY
Relative Accuracy
Relative accuracy or endpoint nonlinearity is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero error and full-scale error and is normally
expressed in least significant bits or as a percentage of full-
scale reading.
Differential Nonlinearity
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
over the operating temperature range ensures monotonicity.
Gain Error
Gain error is a measure of the output error between an ideal
DAC and the actual device output. It is measured with all 1s
in the DAC after the offset error has been adjusted out and is
expressed in least significant bits. Gain error is adjustable to
zero with an external potentiometer.
Rev. B | Page 8 of 16
Digital-To-Analog Glitch Impulse
The amount of charge injected from the digital inputs to the
analog output when the inputs change state is called digital-to-
analog glitch impulse. This is normally specified as the area of
the glitch in either pA-secs or nV-secs depending upon whether
the glitch is measured as a current or voltage. It is measured
with V
Output Capacitance
This is the capacitance from I
Output Leakage Current
Output leakage current is current which appears at I
DAC register loaded to all 0s.
Multiplying Feedthrough Error
This is the ac error due to capacitive feedthrough from the V
terminal to I
REF
= AGND.
OUT
with the DAC register loaded to all zeros.
OUT
to AGND.
OUT
with the
REF