M38510/20704BEA QP SEMICONDUCTOR, M38510/20704BEA Datasheet - Page 18

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M38510/20704BEA

Manufacturer Part Number
M38510/20704BEA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of M38510/20704BEA

Lead Free Status / RoHS Status
Not Compliant
See footnotes at end of table.
Subgroup Symbol
T
25 ° C
C
1
2
3
=
Same tests, terminal conditions, and limits as for subgroup 1, except T
Same tests, terminal conditions, and limits as for subgroup 1, except T
I
V
V
I
I
I
CEX
I
IH1
IH2
CC
OL
IL
IC
method
STD-
3007
3009
3010
3005
MIL-
883
Cases
Test
E,F
no.
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
1
2
3
4
5
6
7
8
9
16mA
5.2V
O
1
1
16mA
5.2V
O
2
2
Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage;
16mA
5.2V
O
3
3
16mA
5.2V
O
4
4
TABLE III. Group A inspection for device types 01 and 03.
16mA
5.2V
O
5
5
inputs not designated are ≥ 2.0 V, low ≤ 0.8 V).
16mA
5.2V
C
C
O
= 125 ° C and V
= -55 ° C and V
6
6
16mA
5.2V
O
7
7
IC
IC
GND
GND
tests are omitted.
tests are omitted.
8
16mA
5.2V
O
9
8
1/ 2/ 3/
-10mA
GND
0.5V
5.5V
10
A
0
-10mA
1/ 3/
GND
0.5V
5.5V
11
A
1
-10mA
1/ 3/
0.5V
5.5V
GND
12
A
2
-10mA
1/ 3/
0.5V
5.5V
GND
A
13
3
-10mA
1/ 2/ 3/
GND
0.5V
5.5V
14
A
4/
4
-10mA
GND
0.5V
0.5V
4.5V
CE
15
5/
4.5V
5.5V
V
16
CC
Measured
terminal
CE
CE
CE
V
A
A
A
A
A
O
O
O
O
O
O
O
O
A
A
A
A
A
A
A
A
A
A
O
O
O
O
O
O
O
O
CC
0
1
2
3
4
0
1
2
3
4
0
1
2
3
4
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
Min
-1.0
Test limits
Max
-250
-1.5
100
130
0.5
50
Unit
mA
μ A
V

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