M38510/20704BEA QP SEMICONDUCTOR, M38510/20704BEA Datasheet - Page 23

• Manufacturer Part Number: M38510/20704BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/20704BEA

• Lead Free Status / RoHS Status: Not Compliant

10/ SEQUENTIAL (PROGRAMMED PROM).
11/ For unprogrammed 01, 02 devices (with date codes before 8601), apply 10.0 V to pin 10 ( A
12/ For unprogrammed 02 devices ( V
13/ For unprogrammed devices 01, 02 (with date codes of 8601 or later), 03 and 04, apply 10.0 V to pin 10 ( A
This program will test all bits in the array for t
Description:
Step 1. Each word in the pattern is tested from the enable lines to the output lines for recovery.
Step 2. Word 0 is addressed. Enable line is pulled high to low and low to high. t
Step 3. Word 1 is addressed. Same enable sequence as above.
Step 4. The reading procedure continues until word 255 is reached.
Step 5. Pass execution time = 256 x cycle time.
Step 6. The sequential tests shall be performed with V
pin 11 ( A
13 ( A
13 ( A
0.5 V to pins 12, 13, 14, ( A
3
3
), and 11.5 V to pin 14 ( A
), and 10.5 V to pin 14 ( A
1
), and other 5.0 V on all other addresses for circuit C.
2
, A
3
TABLE III. Group A inspection – Continued.
, A
4
4
OH
4
), with date codes of 8713 or later apply 3.0 V to pins 10 ( A
) for circuit G.
) and 5.0 V to all other addresses for circuit C.
test ), with date codes before 8713, apply 0 V to pins 10 ( A
MIL-M-38510/207E
PHL2
and t
23
PLH2
CC
= 4.5 V and 5.5 V.
.
PHL2
and t
0
PLH2
), apply 0.5 V to
0
) through
0
are read.
) through
0
),