5962-9071506MUA QP SEMICONDUCTOR, 5962-9071506MUA Datasheet - Page 11

• Manufacturer Part Number: 5962-9071506MUA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9071506MUA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
1/ AC tests are performed with input rise and fall times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to
2/ These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
3/ V
4/ Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to the
5/ Transition is measured at steady state high level -500 mV or steady-state low level +500 mV on the output from the 1.5 V
6/ Pulse widths less than minimum are not allowed.
7/ Only applies to read data flow-through mode.
8/ Values guaranteed by design and not currently tested.
Expansion out low
Expansion out high
delay from clock
delay from clock
3.0 V, and the output load in figure 4, circuit A.
limits specified in table I.
level on the input, with output load figure 4 circuit B.
IH
is 2.2 V minimum for all input pins except XI which is 3.5 V minimum.
DEFENSE SUPPLY CENTER COLUMBUS
Test
4/
4/
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
t
t
Symbol
XOL
XOH
TABLE I. Electrical performance characteristics - continued.
See figure 3
unless otherwise specified
-55°C ≤ T
4.5 V ≤ V
Conditions
C
CC
≤ +125°C
≤ 5.5 V
1/
SIZE
A
subgroups
9, 10, 11
9, 10, 11
Group A
REVISION LEVEL
Device
type
01
03
04
05
06
07
01
03
04
05
06
07
02
02
B
Min
Limits
120
120
Max
SHEET
80
65
50
40
30
20
80
65
50
40
30
20
5962-90715
11
Unit
ns
ns