5962-8953702YA QP SEMICONDUCTOR, 5962-8953702YA Datasheet - Page 10

• Manufacturer Part Number: 5962-8953702YA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8953702YA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
prior to quality conformance inspection. The following additional criteria shall apply:
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883
including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
DEFENSE SUPPLY CENTER COLUMBUS
a.
b.
c.
a.
b.
c.
e.
d. Devices shall be tested for programmability and ac performance compliance to the requirements of group A, subgroups
9, 10, and 11. Either of two techniques is acceptable:
(1) Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify programmability
(2) If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
Burn-in test (method 1015 of MIL-STD-883).
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
(2) T
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
All devices processed to an altered item drawing may be programmed either before or after burn-in at the discretion of
the manufacturer. The required electrical testing shall include, as a minimum, the final electrical tests for programmed
devices as specified in table II.
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C IN and C OUT measurements) shall be measured only for initial test and after any process or design
changes which may affect input or output capacitance. Sample size is 15 devices with no failures, and all input and
output terminals tested.
Subgroups 7 and 8 shall include verification of the pattern specified in 4.3.1d.
COLUMBUS, OHIO 43218-3990
and ac performance without programming the user array. If this is done, the resulting test patterns shall be verified
on all devices during subgroups 9, 10, and 11, group A testing in accordance with the sampling plan specified in
MIL-STD-883, method 5005.
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 3.2.3.1). If more than two devices fail to program, the lot shall be rejected. At the
manufacturer's option, the sample may be increased to 24 total devices with no more than 4 total device failures
allowable. Ten devices from the programmability sample shall be submitted to the requirements of group A,
subgroups 9, 10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the
sample may be increased to 20 total devices with no more than 4 total device failures allowable.
MICROCIRCUIT DRAWING
level control and shall be made available to the preparing or procuring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
A
= +125°C, minimum.
STANDARD
SIZE
A
REVISION LEVEL
B
SHEET
5962-89537
10