5962-89815013A E2V, 5962-89815013A Datasheet - Page 4

• Manufacturer Part Number: 5962-89815013A
• Manufacturer: E2V

Specifications of 5962-89815013A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
drawing shall be as specified on figure 2. When required in screening (see 4.2) group A, C, or D (see 4.3), the devices shall be
programmed by the manufacturer prior to test with a checkerboard pattern or equivalent (a minimum of 50 percent of the total
number of bits programmed) or to any altered item drawing pattern which includes at least 25 percent of the total number of bits
programmed.
drawing.
as specified in table I and shall apply over the full case operating temperature range.
tests for each subgroup are described in table I.
in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN
number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
with each lot of microcircuits delivered to this drawing.
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
manufacturer prior to delivery.
specified by the manufacturer.
procedures and characteristics specified by the manufacturer.
specified program, or erased. As a minimum, verification shall consist of performing a functional test (subgroup 7) to verify that
all bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure, and shall be
removed from the lot.
be done for initial characterization and after any design or process change which may affect data retention. The methods and
procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military
temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of
the acquiring or preparing activity, along with test data.
done for initial characterization and after any design or process change which may affect the reprogrammability of the device.
The methods and procedures may be vendor specific, but shall guarantee the number of program/erase endurance cycles listed
in section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept under document control and
shall be made available upon request of the acquiring or preparing activity, along with test data.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
3.10 Processing EPROMS. All testing requirements and quality assurance provisions herein, shall be satisfied by the
3.10.1 Erasure of EPROMS. When specified, devices shall be erased in accordance with the procedures and characteristics
3.10.2 Programmability of EPROMS. When specified, devices shall be programmed to the specified pattern using the
3.10.3 Verification of programmed or erased EPROMs. When specified, devices shall be verified as either programmed to a
3.11 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall
3.2.3.1 Unprogrammed or erased devices. The truth table for unprogrammed devices for contracts involving no altered item
3.2.3.2 Programmed devices. The truth table for programmed devices shall be as specified by an attached altered item
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided
3.12 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This test shall be
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
B
SHEET
5962-89815
4