5962-8873501LA E2V, 5962-8873501LA Datasheet - Page 5
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5962-8873501LA
Manufacturer Part Number
5962-8873501LA
Description
Manufacturer
E2V
Datasheet
1.5962-8873501LA.pdf
(15 pages)
Specifications of 5962-8873501LA
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DSCC FORM 2234
APR 97
4.3.2 Groups C and D inspections.
4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer.
d.
e.
a.
b.
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
group A, subgroups 9, 10, and 11. Either of two techniques is acceptable:
Subgroups 7 and 8 shall include verification of the truth table.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify
(2) If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
MICROCIRCUIT DRAWING
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
COLUMBUS, OHIO 43218-3990
programmability and ac performance without programming the user array. If this is done, the resulting test
patterns shall be verified on all devices during subgroups 9, 10, and 11, group A testing in accordance with the
sampling plan specified in MIL-STD-883, method 5005.
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming (see 4.4). If more than two devices fail to program, the lot shall be rejected. At the manufacturer's
option, the sample may be increased to 24 total devices with no more than four total device failures allowable.
Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9,
10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may
be increased to 20 total devices with no more than four total device failures allowable.
A
= +125°C, minimum.
STANDARD
SIZE
A
REVISION LEVEL
E
SHEET
5962-88735
5