5962-8996702M3A E2V, 5962-8996702M3A Datasheet - Page 5
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5962-8996702M3A
Manufacturer Part Number
5962-8996702M3A
Description
Manufacturer
E2V
Datasheet
1.5962-8996702M3A.pdf
(18 pages)
Specifications of 5962-8996702M3A
Lead Free Status / RoHS Status
Supplier Unconfirmed
DSCC FORM 2234
APR 97
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
microcircuit group number 42 (see MIL-PRF-38535, appendix A).
a wide variety of configurations, two processing options are provided for selection in the contract using an altered item drawing.
and table IIA. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program
configuration.
herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to delivery.
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
3.11 Processing options. Since the device is capable of being programmed by either the manufacturer or the user to result in
3.11.1 Unprogrammed device delivered to the user. All testing shall be verified through group A testing as defined in 3.2.3.1
3.11.2 Manufacturer-programmed device delivered to the user. All testing requirements and quality assurance provisions
4.2.1 Additional criteria for device class M.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
a.
b.
c.
d.
(1)
(1) Program 100 percent of the total number of cells, excluding the security bit.
(2) Bake, unbiased, for 72 hours at +140°C or for 48 hours at +150°C or for 8 hours at +200°C, or 2 hours at +300°C for
(3) Perform margin test using Vm = +5.7 V at +25°C using loose timing (i.e., t
(4) Erase.
(Steps 1 through 4 are performed at the wafer level.)
Delete the sequence specified as initial (preburn-in) electrical parameters through interim (postburn-in) electrical
The test circuit shall be maintained by the manufacturer under document revision level control and shall be made
Interim and final electrical test parameters shall be as specified in table IIA herein.
A data retention stress test shall be included as part of the screening procedure and shall consist of the following:
DEFENSE SUPPLY CENTER COLUMBUS
parameters of method 5004 and substitute lines 1 through 6 of table IIA herein.
available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases,
and power dissipation, as applicable, in accordance with the intent specified in method 1015.
unassembled devices only.
Dynamic burn-in (method 1015 of MIL-STD-883, test condition D; for circuit, see 4.2.1b herein).
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
SA
≥ 1 µs).
A
SHEET
5962-89967
5