5962-9061102YA QP SEMICONDUCTOR, 5962-9061102YA Datasheet - Page 3

• Manufacturer Part Number: 5962-9061102YA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9061102YA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-
PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying
activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan
may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device.
These modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-
PRF-38535 is required to identify when the QML flow option is used.
in MIL-PRF-38535, appendix A and herein.
drawing shall be as specified on figure 2. When required in groups A, B, C, or D (see 4.3), the devices shall be programmed by
the manufacturer prior to test. A minimum of 50 percent of the total number of cells shall be programmed or at least 25 percent
of the total number of cells to any altered item drawing.
drawing.
as specified in table I and shall apply over the full case operating temperature range.
tests for each subgroup are described in table I.
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
(Copies of these documents are available online at
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
3. REQUIREMENTS
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth tables. The truth tables shall be as specified on figure 2.
3.2.3.1 Unprogrammed or erased devices. The truth table for unprogrammed devices for contracts involving no altered item
3.2.3.2 Programmed devices. The truth table for programmed devices shall be as specified by an attached altered item
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
2. APPLICABLE DOCUMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
DEPARTMENT OF DEFENSE SPECIFICATION
DEPARTMENT OF DEFENSE STANDARDS
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
MIL-STD-883
MIL-STD-1835 -
MIL-HDBK-103 -
MIL-HDBK-780 -
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
-
STANDARD
Interface Standard Electronic Component Case Outlines.
Standard Microcircuit Drawings.
Test Method Standard Microcircuits.
List of Standard Microcircuit Drawings.
http://assist.daps.dla.mil/quicksearch/
SIZE
A
REVISION LEVEL
or
B
http://assist.daps.dla.mil
SHEET
5962-90611
or from
3