5962-88670043A E2V, 5962-88670043A Datasheet - Page 10

• Manufacturer Part Number: 5962-88670043A
• Manufacturer: E2V

Specifications of 5962-88670043A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
a.
b.
c.
d.
(1)
(2)
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input capacitance. Sample size is 15 devices with no failures, and all input and output
terminals tested.
Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
group A, subgroups 9, 10, and 11.
DEFENSE SUPPLY CENTER COLUMBUS
A sample shall be selected to satisfy programmability requirements prior to performing subgroups 9, 10, and 11.
Twelve devices shall be submitted to programming (see 3.2.3.1). If more than two devices fail to program, the lot
shall be rejected. At the manufacturer's option, the sample may be increased to 24 total devices with no more
than 4 total device failures allowable.
Ten devices from the programmability sample shall be submitted to the requirements of group A, subgroups 9,
10, and 11. If more than two devices fail, the lot shall be rejected. At the manufacturer's option, the sample may
be increased to 20 total devices with no more than 4 total device failures allowable.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
Final electrical test parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point
Interim electrical parameters
STANDARD
IN
(method 5004) for unprogrammed
devices
(method 5004) for programmed
devices
(method 5005)
electrical parameters (method 5005)
(method 5004)
and C
MIL-STD-883 test requirements
1/ * indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ ** see 4.3.1c.
4/ Subgroups 7 and 8 functional tests shall also verify that no cells are
programmed for unprogrammed devices or that the altered item
drawing pattern exists for programmed devices.
OUT
measurement) shall be measured only for the initial test and after process or design
TABLE II. Electrical test requirements. 1/, 2/, 3/, 4/
MIL-STD-883, method 5005, table I)
SIZE
A
(in accordance with
8A, 8B, 9, 10, 11
2, 3, 7, 8A, 8B
1, 2, 3, 4**, 7,
1*, 2, 3, 7*,
1*, 2, 3, 7*,
Subgroups
8A, 8B, 9
8A, 8B
REVISION LEVEL
1
E
SHEET
5962-88670
10