5962-8607101CA QP SEMICONDUCTOR, 5962-8607101CA Datasheet - Page 8

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5962-8607101CA

Manufacturer Part Number
5962-8607101CA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-8607101CA

Technology
Bipolar
Number Of Elements
1
Number Of Bits
8
Logic Family
F
Logical Function
Shift Register
Operating Supply Voltage (typ)
5V
Propagation Delay Time
17ns
Operating Temp Range
-55C to 125C
Operating Supply Voltage (min)
4.5V
Operating Supply Voltage (max)
5.5V
Operating Temperature Classification
Military
Mounting
Through Hole
Pin Count
14
Lead Free Status / RoHS Status
Not Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
5962-8607101CA
Manufacturer:
TI
Quantity:
1 049
DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
a.
b.
c.
a.
b.
(1)
(2)
(3)
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
Subgroups 4, 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 7 shall include verification of the truth table.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1005 of MIL-STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
A
= +125  C, minimum.
STANDARD
* PDA applies to subgroup 1.
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point
MIL-STD-883 test requirements
(method 5004)
(method 5004)
(method 5005)
electrical parameters
(method 5005)
TABLE II. Electrical test requirements.
MIL-STD-883, method 5005,
SIZE
A
(in accordance with
1, 2, 3, 7, 9, 10, 11
1*, 2, 3, 7, 9
Subgroups
table I)
1, 2, 3
- - -
REVISION LEVEL
D
SHEET
5962-86071
8

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