M38510/01205BEA E2V, M38510/01205BEA Datasheet - Page 53

• Manufacturer Part Number: M38510/01205BEA
• Manufacturer: E2V

Specifications of M38510/01205BEA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
parameters shall be as specified in table II herein.
conventional current and positive when flowing into the referenced terminal.
order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need
to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by
the Inventory Control Point's packaging activity within the Military Service, or Defense Agency, or within the military service’s
system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's
automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical
4.5 Methods of inspection. Methods of inspection shall be specified and as follows.
4.5.1 Voltage and current. All voltage values given are referenced to the microcircuit ground terminals. Currents given are
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or
a.
b.
a.
b.
Tests shall be as specified in table II herein.
Subgroups 4, 5, and 6 shall be omitted.
End point electrical parameters shall be as specified in table II herein.
The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
MIL-M-38510/12J
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