AD5204BN100 Analog Devices Inc, AD5204BN100 Datasheet - Page 16

• Manufacturer Part Number: AD5204BN100
• Description: IC DGTL POT QUAD 256POS 24-DIP
• Manufacturer: Analog Devices Inc

Specifications of AD5204BN100

• Mounting Type: Through Hole
• Package / Case: 24-DIP (0.300", 7.62mm)
• Rohs Status: RoHS non-compliant
• Taps: 256
• Resistance (ohms): 100K
• Number Of Circuits: 4
• Temperature Coefficient: 700 ppm/°C Typical
• Memory Type: Volatile
• Interface: SPI, 3-Wire Serial
• Voltage - Supply: 2.7 V ~ 5.5 V, ±2.3 V ~ 2.7 V
• Operating Temperature: -40°C ~ 85°C
• Resistance In Ohms: 100K
• Potentiometer Ic Case Style: DIP
• End To End Resistance: 100ohm
• No. Of Pots: Quad
• No. Of Pins: 24

AD5204/AD5206
TEST CIRCUITS
Figure 27. Potentiometer Divider Nonlinearity Error Test Circuit (INL, DNL)
V+
I
MS
DUT
B
A
Figure 26. ESD Protection of Resistor Terminals
W
Figure 28. Resistor Position Nonlinearity Error
I
Figure 25. ESD Protection of Digital Pins
V+
W
Figure 29. Wiper Resistance Test Circuit
=
(Rheostat Operation; R-INL, R-DNL)
NO CONNECT
V
W
A, B, W
1V/R
V
MS
NOMINAL
340kΩ
DUT
DUT
A
B
A
B
W
W
V
SS
V
V+
R
WHERE V
AND V
SS
W
V
MS
=
V
LOGIC
V+ = V
1LSB = V+/256
W2
V
DD
W2
I
V
W
MS
W1
= V
– [V
DD
= V
MS
W1
MS
WHEN I
+ I
WHEN I
I
W
W
(R
W
AW
= 1/R
W
II R
= 0
BW
)]
Rev. C | Page 16 of 20
V+
Figure 30. Power Supply Sensitivity Test Circuit (PSS, PSRR)
Figure 32. Noninverting Programmable Gain Test Circuit
OFFSET
Figure 31. Inverting Programmable Gain Test Circuit
~
OFFSET
Figure 34. Incremental On-Resistance Test Circuit
OFFSET
GND
V
GND
GND
DD
Figure 33. Gain vs. Frequency Test Circuit
V
IN
A
B
V
DUT
A
W
B
DUT
W
A
V
IN
V
OFFSET BIAS
V
2.5V
OFFSET BIAS
MS
IN
V
DUT
SS
B
I
A
A
SW
W
TO V
CODE = 0x00
DUT
R
W
W
B
SW
DD
OP279
=
V+ = V
PSRR (dB) = 20 log
PSS (%/%) =
OP42
OP279
B
0.1V
I
+15V
–15V
SW
+
–
5V
DD
5V
0.1V
± 10%
∆V
∆V
V
V
MS
DD
OUT
OUT
V
%
%
OUT
(
∆V
∆V
MS
DD
)