AD5204BN100 Analog Devices Inc, AD5204BN100 Datasheet - Page 6

IC DGTL POT QUAD 256POS 24-DIP

AD5204BN100

Manufacturer Part Number
AD5204BN100
Description
IC DGTL POT QUAD 256POS 24-DIP
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5204BN100

Mounting Type
Through Hole
Package / Case
24-DIP (0.300", 7.62mm)
Rohs Status
RoHS non-compliant
Taps
256
Resistance (ohms)
100K
Number Of Circuits
4
Temperature Coefficient
700 ppm/°C Typical
Memory Type
Volatile
Interface
SPI, 3-Wire Serial
Voltage - Supply
2.7 V ~ 5.5 V, ±2.3 V ~ 2.7 V
Operating Temperature
-40°C ~ 85°C
Resistance In Ohms
100K
Potentiometer Ic Case Style
DIP
End To End Resistance
100ohm
No. Of Pots
Quad
No. Of Pins
24
Lead Free Status / RoHS Status
AD5204/AD5206
ABSOLUTE MAXIMUM RATINGS
T
Table 2.
Parameter
V
V
V
V
I
Digital Input and Output Voltage
Operating Temperature Range
Maximum Junction Temperature
Storage Temperature
Reflow Soldering
Package Power Dissipation
Thermal Resistance, θ
1
2
A
Maximum terminal current is bounded by the maximum current handling of
Thermal resistance (JEDEC 4-layer (2S2P) board). Paddle soldered to board.
the switches, maximum power dissipation of the package, and maximum
applied voltage across any two of the A, B, and W terminals at a given
resistance.
DD
SS
DD
A
A
, I
, V
Pulsed
Continuous
to GND
(T
Peak Temperature
Time at Peak Temperature
PDIP (N-24-1)
SOIC (RW-24)
TSSOP (RU-24)
LFCSP (CP-32-3)
= 25°C, unless otherwise noted.
B
to GND
to GND
to V
, I
J
B
10 kΩ End-to-End Resistance
50 kΩ and 100 kΩ End-to-End
, V
W
max)
W
Resistance
SS
1
to GND
JA
2
Rating
−0.3 V to +7 V
0 V to −7 V
7 V
V
±20 mA
±11 mA
±2.5 mA
−0.3 V to (V
(whichever is less)
−40°C to +85°C
150°C
−65°C to +150°C
260°C
20 sec to 40 sec
(T
63°C/W
52°C/W
50°C/W
32.5°C/W
SS
J
, V
max − T
DD
DD
A
)/θ
+ 0.3 V) or 7 V
JA
Rev. C | Page 6 of 20
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

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