AD5235BRU25 Analog Devices Inc, AD5235BRU25 Datasheet - Page 8

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AD5235BRU25

Manufacturer Part Number
AD5235BRU25
Description
IC POT DUAL 25K 1024POS 16-TSSOP
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5235BRU25

Rohs Status
RoHS non-compliant
Taps
1024
Resistance (ohms)
25K
Number Of Circuits
2
Temperature Coefficient
35 ppm/°C Typical
Memory Type
Non-Volatile
Interface
4-Wire SPI Serial
Voltage - Supply
3 V ~ 5.5 V, ±2.25 V ~ 2.75 V
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
16-TSSOP
Resistance In Ohms
25K
End To End Resistance
25kohm
Track Taper
Logarithmic
Resistance Tolerance
± 30%
No. Of Steps
1024
Supply Voltage Range
3V To 5.5V, ± 2.25V To ± 2.75V
Control Interface
Serial, SPI
For Use With
EVAL-AD5235EBZ - BOARD EVALUATION FOR AD5235
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
AD5235
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V
V
V
I
Digital Input and Output Voltage to GND
Operating Temperature Range
Maximum Junction Temperature (T
Storage Temperature Range
Lead Temperature, Soldering
Thermal Resistance
Package Power Dissipation
1
2
A
Maximum terminal current is bounded by the maximum current handling of
the switches, maximum power dissipation of the package, and maximum
applied voltage across any two of the A, B, and W terminals at a given
resistance.
Includes programming of nonvolatile memory.
DD
SS
DD
A
A
, I
, V
Pulsed
Continuous
Vapor Phase (60 sec)
Infrared (15 sec)
Junction-to-Ambient θ
Junction-to-Case θ
= 25°C, unless otherwise noted.
B
to GND
to GND
to V
, I
B
, V
W
W
SS
1
to GND
JC
, TSSOP-16
JA
,TSSOP-16
2
J
max)
Rating
–0.3 V to +7 V
+0.3 V to −7 V
7 V
V
±20 mA
±2 mA
−0.3 V to V
−40°C to +85°C
150°C
−65°C to +150°C
215°C
220°C
150°C/W
28°C/W
(T
SS
J
max − T
− 0.3 V to V
DD
A
)/θ
+ 0.3 V
DD
JA
Rev. D | Page 8 of 32
+ 0.3 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

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