66741-8 TE Connectivity, 66741-8 Datasheet - Page 2

CONTACT, SOCKET, 10AWG, CRIMP

66741-8

Manufacturer Part Number
66741-8
Description
CONTACT, SOCKET, 10AWG, CRIMP
Manufacturer
TE Connectivity
Series
Type XIIr
Datasheets

Specifications of 66741-8

Connector Type
Contact, Crimp
Current Rating
35A
Contact Plating
Tin
Contact Material
Copper
Contact Termination
Crimp
Rohs Compliant
No
Contact Gender
Socket
Insulation Support
Yes
Termination Method To Wire/cable
Crimp
Wire/cable Type
Discrete Wire
Grade
Commercial
High Current
No
Termination End Plating
Tin-Lead
Wire Range (mm [awg])
5.00-6.00² [10]
Used With
G Series Connectors, M Series Connectors, CPC Connectors
Contact Type
Socket
Contact Classification
Power
Contact Plating, Mating Area, Material
Tin-Lead
Contact Base Material
Copper
Contact Size
Power Contact
Rohs/elv Compliance
Not ELV/RoHS compliant
Lead Free Solder Processes
Not relevant for lead free process
Accepts Wire Insulation Diameter, Range (mm [in])
4.83 – 5.59 [0.190 – 0.220]
Applies To
Wire/Cable
Test Current (a)
15.0
Packaging Method
Loose Piece
For Use With
G Series, M Series, CPC Connectors
3.5.
Test Description
Examination of Product
Termination Resistance, Specified
Current
Termination Resistance,
Dry Circuit
Current Cycling
Vibration
Physical Shock
Engaging Force
Separation Force
Rev A
Test Requirements and Procedures Summary
Requirement
Meets requirements of product
drawing and applicable TE
application specification.
1.0 milliohm maximum final
.5 milliohm maximum initial.
.6 milliohm maximum final, gold
and silver
.4.0 milliohms maximum final, tin-
lead.
See note (a).
No discontinuities greater than 1
microsecond. See Note.
No discontinuities greater than 1
microsecond. See note (a).
5.5 pounds maximum.
.25 pound minimum
AWG
10
12
14
16
Figure 1 (continued)
MECHANICAL
ELECTRICAL
Amperes
25
18
15
13
Procedure
Visual, dimensional and functional
per applicable quality inspection
plan.
Measure resistance of mated
contacts assembled in housing;
Test Specification 109-25, see
Figure 3
Subject mated contacts assembled
in housing to 50 mv open circuit at
100 ma maximum, see Figure 3;
Test Specification 109-6-1.
Subject mated contacts to 500
cycles at 125% current specified
for applicable wire gage for 15
minutes "ON" and 15 minutes
"OFF"; Test Specification 109-51,
cond B, method 2.
Subject mated contacts assembled
in housing to 15 G's with 100 ma
current applied, See Figure 4; Test
Specification 109-21-3 for gold and
silver. Test Specification 109-21-1
for tin-lead. 8 hours in each of 3
mutually perpendicular axis.
Subject mated contacts assembled
in housings to 100 G's sawtooth
shock pulses of 6 millisecond
Measure force to engage
Size each contact 8 times.
duration, 3 shocks in
each direction along the
3 mutually perpendicular
axis.
at a rate of 1 inch/
minute, see Figure 5;
Test Specification 109-35,
engagement depth .250
inch.
Measure force to separate
at a rate of 1 inch/
minute; Test Specification 109-35,
separation depth .250
inch.
108-10037
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