LQ150X1LG55 Sharp Electronics, LQ150X1LG55 Datasheet - Page 22

• Manufacturer Part Number: LQ150X1LG55
• Manufacturer: Sharp Electronics

Specifications of LQ150X1LG55

• Lead Free Status / Rohs Status: Compliant

13．Reliability test items
【Note】
【Result Evaluation Criteria】
No
１
２
３
４
５
６
７
８
９
which may affect practical display function. (normal operation state：Temperature:15∼35℃,
Humidity:45∼75％, Atmospheric pressure:86∼106kpa)
A gap of panel shall not occur by vibration or the shock.
Under the display quality test conditions with normal operation state, these shall be no change
Test item
High temperature
High temperature operation test
High temperature storage test
Low temperature operation test
Low temperature storage test
Vibration test
(non- operating)
Shock test
(non- operating)
Thermal shock test
(Storage)
Altitude
& high humidity operation test
Waveform : Sine wave
Frequency : 10∼57Hz/Vibration width (one side) : 0.075mm
Sweep time : 11minutes
Test period : 3 hours
Max. gravity : 490m/s
Pulse width : 11ms, half-sine wave
Direction : ±X, ±Y, ±Z,
Ta=-25℃∼60℃ ; 5 cycles
Test period : 10 hours (1 hour for each temperature)
Ta=50℃,70kPa,3,048m(10,000ft), t=24h (Operating)
Ta=70℃,12kPa,15,240m(50,000ft), t=24h (Storage)
Conditions
Ta = 40℃ ; 95%RH 240h
(No condensation)
Ta = 60℃(Panel surface），240h
(The panel temp. must be less than 60℃)
Ta = 60℃
Ta = 0℃
Ta = -25℃
once for each direction.
: 57∼500Hz/Gravity : 9.8m/s
(1 hour for each direction of X,Y,Z)
240h
240h
240h
2
2
LD19512C-19
【Note】
【Note】