M38510/76302BEA QP SEMICONDUCTOR, M38510/76302BEA Datasheet - Page 78

• Manufacturer Part Number: M38510/76302BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/76302BEA

• Lead Free Status / Rohs Status: Supplier Unconfirmed

T
Subgroup
C
1/
2/
3/
4/
5/
6/
7/
8/
9/
10/ H > 1.5 V; L < 1.5 V.
11/ F
12/ Momentary 3.0 V (min), then ground. Maintain ground for measurement.
= +125 C
10
11
Case 2 pins not referenced are N/C.
For test 1, 4 mA +I
Apply 4.5 V pulse, then ground prior to taking measurements to set device in the desired state.
Maintain ground for measurement.
Input pulse must be applied one time after R
Input pulse must be applied twice after R
Input pulse must be applied four times after R
I
Only a summary of attributes data is required.
A = 3.0 V minimum; B = 0.0 V or GND.
one-half the input frequency.
IL
MAX
limits (mA) min/max values for circuits shown:
Parameter
min limit specified is the frequency of the input pulse. The output frequency shall be
I
I
I
IL1
IL2
IL3
Same tests, terminal conditions, and limits as for subgroup 10 except, T
Symbol
F
t
t
t
t
PLH1
PHL1
PLH2
PHL2
MAX
Terminals
R
R
MIL-STD-
method
(Fig. 5)
IL3
O
O
A
B
3003
(1)
(2)
883
(max).
"
"
"
"
-0.5/-2.0
-0.4/-1.6
-12/-.36
Cases 1/
A,B,C,D
Test no.
Cases
A
"
82
83
84
85
86
2
O
pulse.
O
-.03/-.40
-1.0/-2.4
-0.4/-1.6
O
pulse.
IN
IN
1
B
2
pulse.
B
"
R
GND
GND
GND
12/
12/
O
2
3
(1)
-0.5/-2.0
-0.4/-1.6
-12/-.36
Terminal conditions (pins not designated may be H
C
"
R
O
3
4
A
A
(2)
TABLE III. Group A inspection for device type 02 - Continued
-.03/-.40
-1.0/-2.4
-0.4/-1.6
Circuits
D
NC
"
4
6
C
= 55 C
5.0 V
-1.0/-2.4
-.65/-1.6
V
-12/-.36
5
8
CC
"
"
"
"
E
"
NC
6
9
-0.5/-2.0
-0.4/-1.6
-12/-.36
F
"
NC
10
7
OUT
OUT
2.0 V or L
12
Q
G
8
C
Q
13
9
B
0.7 V or open).
GND
GND
10
14
"
"
"
"
OUT
OUT
Q
11
16
D
OUT
Q
12
18
A
NC
13
19
IN 11/
14
20
IN
IN
A
Measured
terminal
A to Q
A to Q
B to Q
B to Q
A to Q
A
C
C
D
D
Min
29
3
"
"
"
Limits
Max
74
81
78
78
MHz
Unit
ns
"
"
"