54ACQ245LMQB. National Semiconductor, 54ACQ245LMQB. Datasheet - Page 12

• Manufacturer Part Number: 54ACQ245LMQB.
• Manufacturer: National Semiconductor

Specifications of 54ACQ245LMQB.

• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
NOTES:
1. When measuring t
2. When measuring t
3. The t
4. C
5. R
6. Input signal from pulse generator: V
7. Timing parameters shall be tested at a minimum input frequency of 1 MHz.
8. The outputs are measured one at a time with one transition per measurement.
except when disabled by the output enable control. The t
with internal conditions such that the output is at V
from 0.3V
DEFENSE SUPPLY CENTER COLUMBUS
L
L
= 50 pF minimum or equivalent (includes test jig and probe capacitance).
= 500Ω or equivalent. R
PZL
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
and t
CC
to 0.7V
PLZ
STANDARD
reference waveform is for the output under test with internal conditions such that the output is at V
PLZ
PHZ
CC
, t
and t
and from 0.7V
PZH
, t
PZL
T
PLH
= 50Ω or equivalent.
: V
FIGURE 5. Switching waveforms and test circuit.
, and t
TEST
IN
CC
PHL
= 2 x V
= 0.0 V to V
to 0.3V
: V
TEST
CC
.
CC
= Open.
, respectively; duty cycle = 50 percent.
OH
CC
; PRR ≤ 10 MHz; t
except when disabled by the output enable control.
PZH
and t
SIZE
A
PHZ
reference waveform is for the output under test
r
≤ 2.5 ns; t
REVISION LEVEL
f
≤ 2.5 ns; t
B
r
and t
f
shall be measured
SHEET
5962-92177
12
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