54ACQ245LMQB. National Semiconductor, 54ACQ245LMQB. Datasheet - Page 15

• Manufacturer Part Number: 54ACQ245LMQB.
• Manufacturer: National Semiconductor

Specifications of 54ACQ245LMQB.

• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
Currents given are conventional current and positive when flowing into the referenced terminal.
Q and V or MIL-PRF-38535, appendix A for device class M.
temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with
MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test
circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1005 of MIL-STD-883.
assured (see 3.5 herein).
4.5 Methods of inspection. Methods of inspection shall be specified as follows:
4.5.1 Voltage and current. Unless otherwise specified, all voltages given are referenced to the microcircuit GND terminal.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness
a.
b.
DEFENSE SUPPLY CENTER COLUMBUS
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All
device classes must meet the post-irradiation end-point electrical parameter limits as defined in table I at
T
End-point electrical parameters shall be as specified in table II herein.
A
= +25°C ±5°C, after exposure, to the subgroups specified in table II herein.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
Interim electrical
Final electrical
Group A test
Group C end-point electrical
Group D end-point electrical
Group E end-point electrical
2/ PDA applies to subgroups 1 and 7.
1/ PDA applies to subgroup 1.
parameters (see 4.2)
parameters (see 4.2)
requirements (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
parameters (see 4.4)
STANDARD
Test requirements
TABLE II. Electrical test requirements.
method 5005, table I)
(in accordance with
MIL-STD-883,
1/ 1, 2, 3, 7,
1, 2, 3, 4, 7,
8, 9, 10, 11
8, 9, 10, 11
Subgroups
1, 2, 3
1, 2, 3
1, 7, 9
class M
Device
- - -
SIZE
A
1/ 1, 2, 3, 7,
1, 2, 3, 4, 7,
8, 9, 10, 11
8, 9, 10, 11
1, 2, 3
1, 2, 3
1, 7, 9
class Q
Device
MIL-PRF-38535, table III)
1
REVISION LEVEL
(in accordance with
Subgroups
B
2/ 1, 2, 3, 7,
1, 2, 3, 4, 7,
8, 9, 10, 11
8, 9, 10, 11
class V
Device
1, 2, 3
1, 2, 3
1, 7, 9
1
SHEET
5962-92177
15