LLL153C80J224ME14E Murata Electronics North America, LLL153C80J224ME14E Datasheet - Page 126

• Manufacturer Part Number: LLL153C80J224ME14E
• Description: CAP CER
• Manufacturer: Murata Electronics North America
• Series: LLLr

Specifications of LLL153C80J224ME14E

• Capacitance: 0.22µF
• Voltage - Rated: 6.3V
• Tolerance: ±20%
• Temperature Coefficient: X6S
• Mounting Type: Surface Mount, MLCC
• Operating Temperature: -55°C ~ 105°C
• Applications: Bypass, Decoupling
• Ratings: -
• Package / Case: -
• Size / Dimension: -
• Height: -
• Thickness: -
• Lead Spacing: -
• Features: Low ESL (Reverse Geometry)
• Lead Style: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: LLL153C80J224ME14L; LLL153C80J224ME14L

7
!Note
• This PDF catalog is downloaded from the website of Murata Manufacturing co., ltd. Therefore, it’s specifications are subject to change or our products in it may be discontinued without advance notice. Please check with our
• This PDF catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
sales representatives or product engineers before ordering.
!Note
Mounting for testing: The capacitors should be mounted on the substrate as shown below using die bonding and wire bonding when tests No.11 to 15 are performed.
124
No.
13
14
15
GMA Series Specifications and Test Methods (1)
GMA Series Specifications and Test Methods(1)
Alumina substrate
Continued from the preceding page.
Humidity
(Steady State)
Humidity
Load
High
Temperature
Load
• Please read rating and !CAUTION (for storage, operating, rating, soldering, mounting and handling) in this catalog to prevent smoking and/or burning, etc.
• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
Item
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
Appearance
Capacitance
Change
D.F.
I.R.
No defects or abnormalities
R7: Within T12.5%
R7: W.V.: 10V min.; 0.05 max.
More than 1,000MΩ or 50Ω F
(Whichever is smaller)
No defects or abnormalities
R7: Within T12.5%
R7: W.V.: 10V min.; 0.05 max.
More than 500MΩ or 25Ω F
(Whichever is smaller)
No defects or abnormalities
R7: Within T12.5%
R7: W.V.: 10V min.; 0.05 max.
More than 1,000MΩ or 50Ω F
(Whichever is smaller)
Gold land
In case Non "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (1).
Die bond
Capacitor
Specifications
In case "*" is added in PNs table, please refer to GMA Series Specifications and Test Methods (2).
Alumina substrate
Gold wire
Set the capacitor for 500T12 hours at 40T2D, in 90 to 95%
humidity.
Take it out and set it for 24T2 hours at room temperature, then
measure.
Apply the rated voltage for 500T12 hours at 40T2D, in 90 to
95% humidity and set it for 24T2 hours at room
temperature,then measure. The charge/discharge current is
less than 50mA.
A voltage treatment should be given to the capacitor, in which a
DC voltage of 200% the rated voltage is applied for one hour at
the maximum operating temperature T3D then it should be set
for 24T2 hours at room temperature and the initial measurement
should be conducted.
Then apply the above mentioned voltage continuously for
1000T12 hours at the same temperature, remove it from the
bath, and set it for 24T2 hours at room temperature, then
measure. The charge/discharge current is less than 50mA.
Gold land
Test Method
C02E.pdf
09.9.18