ADG507AKR Analog Devices Inc, ADG507AKR Datasheet - Page 6

• Manufacturer Part Number: ADG507AKR
• Description: IC MULTIPLEXER DUAL 8X1 28SOIC
• Manufacturer: Analog Devices Inc
• Type: Analog Multiplexerr

Specifications of ADG507AKR

• Rohs Status: RoHS non-compliant
• Function: Multiplexer
• Circuit: 2 x 8:1
• On-state Resistance: 700 Ohm
• Voltage Supply Source: Dual Supply
• Voltage - Supply, Single/dual (±): ±10.8 V ~ 16.5 V
• Current - Supply: 20µA
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 28-SOIC (0.300", 7.50mm Width)
• No. Of Channels: 8
• Analog Switch Case Style: WSOIC
• No. Of Pins: 28
• Single Supply Voltage Min (+v): 10.8V
• Analog Multiplexer Type: Differential
• Peak Reflow Compatible (260 C): No
• Leakage Current: 0.04nA
• Package: 28SOIC W
• Maximum On Resistance: 700@16.5V Ohm
• Maximum Propagation Delay Bus To Bus: 300@±16.5V|450@16.5V ns
• Maximum High Level Output Current: 20 mA
• Multiplexer Architecture: 8:1
• Number Of Channels Per Chip: 1
• Maximum Turn-on Time: 450@16.5V ns
• Power Supply Type: Single|Dual
• Multiplexer Configuration: Single 8:1
• Number Of Inputs: 16
• Number Of Outputs: 2
• Number Of Channels: 1
• Analog Switch On Resistance: 700@16.5VOhm
• Analog Switch Turn On Time: 450ns
• Analog Switch Turn Off Time: 450ns
• Package Type: SOIC W
• Power Supply Requirement: Single/Dual
• Single Supply Voltage (min): 10.8V
• Single Supply Voltage (typ): 12/15V
• Single Supply Voltage (max): 16.5V
• Dual Supply Voltage (min): ±10.8V
• Dual Supply Voltage (typ): ±12/±15V
• Dual Supply Voltage (max): ±16.5V
• Power Dissipation: 470mW
• Supply Current: 1.5mA
• Mounting: Surface Mount
• Pin Count: 28
• Operating Temp Range: -40C to 85C
• Operating Temperature Classification: Industrial
• Lead Free Status / Rohs Status: Not Compliant

ADG506A/ADG507A
Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. t
Test Circuit 1. R
Test Circuit 4. I
ON
–Test Circuits
Test Circuit 6. Switching Time of Multiplexer, t
D
(ON)
Test Circuit 7. Break-Before-Make Delay, t
Test Circuit 2. I
–6–
S
(OFF)
R
TRANSITION
OPEN
= t
Test Circuit 5. I
F
= 20 ns.
Test Circuit 3. I
DIFF
D
(OFF)
REV. C