LH28F008SCR-V85 Sharp Electronics, LH28F008SCR-V85 Datasheet - Page 33

• Manufacturer Part Number: LH28F008SCR-V85
• Manufacturer: Sharp Electronics

Specifications of LH28F008SCR-V85

• Cell Type: NOR
• Density: 8Mb
• Access Time (max): 85ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 20b
• Operating Supply Voltage (typ): 5V
• Operating Temp Range: 0C to 70C
• Package Type: TSOP-I
• Sync/async: Asynchronous
• Operating Temperature Classification: Commercial
• Operating Supply Voltage (min): 4.5V
• Operating Supply Voltage (max): 5.5V
• Word Size: 8b
• Number Of Words: 1M
• Supply Current: 50mA
• Mounting: Surface Mount
• Pin Count: 40
• Lead Free Status / Rohs Status: Not Compliant

6.2.6 ALTERNATIVE CE#-CONTROLLED WRITES
NOTES :
1. In systems where CE# defines the write pulse width
2. Sampled, not 100% tested.
3. Refer to Table 3 for valid A
4. V
SYMBOL
• V
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
AVAV
PHEL
WLEL
ELEH
PHHEH
VPEH
AVEH
DVEH
EHDX
EHAX
EHWH
EHEL
EHRL
EHGL
QVVL
QVPH
CC
(within a longer WE# timing waveform), all setup, hold,
and inactive WE# times should be measured relative to
the CE# waveform.
byte write, or lock-bit configuration.
should be held at V
byte write, or lock-bit configuration success (SR.1/3/4/5 = 0).
PP
= 5.0±0.25 V, 5.0±0.5 V, T
should be held at V
Write Cycle Time
RP# High Recovery to CE#
Going Low
WE# Setup to CE# Going Low
CE# Pulse Width
RP# V
V
Address Setup to CE# Going High
Data Setup to CE# Going High
Data Hold from CE# High
Address Hold from CE# High
WE# Hold from CE# High
CE# Pulse Width High
CE# High to RY/BY# Going Low
Write Recovery before Read
V
RY/BY# High
RP# V
RY/BY# High
PP
PP
VERSIONS
Setup to CE# Going High
Hold from Valid SRD,
HH
HH
Setup to CE# Going High
PARAMETER
Hold from Valid SRD,
HH
) until determination of block erase,
PPH1/2
IN
and D
A
(and if necessary RP#
= 0 to +70˚C or –25 to +85
IN
V
V
for block erase,
CC
CC
±0.25 V
±0.5 V
NOTE
2, 4
2, 4
2
2
2
3
3
LH28F008SCH-V85
LH28F008SC-V85/
(NOTE 5)
MIN.
100
100
85
50
40
40
25
- 33 -
1
0
5
5
0
0
0
0
5. See Fig. 9 "Transient Input/Output Reference
6. See Fig. 10 "Transient Input/Output Reference
(NOTE 1)
MAX.
˚
C
90
Waveform" and Fig. 11 "Transient Equivalent Testing
Load Circuit" (High Seed Configuration) for testing
characteristics.
Waveform" and Fig. 11 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
LH28F008SCH-V85
(NOTE 6)
LH28F008SC-V85/
MIN.
100
100
90
50
40
40
25
1
0
5
5
0
0
0
0
MAX.
90
LH28F008SC-V/SCH-V
LH28F008SCH-V12
(NOTE 6)
LH28F008SC-V12/
MIN.
120
100
100
40
50
40
25
1
0
5
5
0
0
0
0
MAX.
90
UNIT
ns
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns