AT29LV256-20TC Atmel, AT29LV256-20TC Datasheet - Page 5

• Manufacturer Part Number: AT29LV256-20TC
• Manufacturer: Atmel

Specifications of AT29LV256-20TC

• Cell Type: NOR
• Density: 256Kb
• Access Time (max): 200ns
• Interface Type: Parallel
• Boot Type: Not Required
• Address Bus: 15b
• Operating Supply Voltage (typ): 3/3.3V
• Operating Temp Range: 0C to 70C
• Package Type: TSOP-I
• Program/erase Volt (typ): 3 to 3.6V
• Sync/async: Asynchronous
• Operating Temperature Classification: Commercial
• Operating Supply Voltage (min): 3V
• Operating Supply Voltage (max): 3.6V
• Word Size: 8b
• Number Of Words: 32K
• Supply Current: 15mA
• Mounting: Surface Mount
• Pin Count: 28
• Lead Free Status / Rohs Status: Not Compliant

4.6
4.7
4.8
5. Absolute Maximum Ratings*
0563E–FLASH–2/07
Temperature Under Bias............................... -55° C to +125° C
Storage Temperature .................................... -65° C to +150° C
All Input Voltages (including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to V
Voltage on A9 (including NC Pins)
with Respect to Ground ...................................-0.6V to +13.5V
DATA Polling
Toggle Bit
Optional Chip Erase Mode
The AT29LV256 features DATA polling to indicate the end of a program cycle. During a pro-
gram cycle an attempted read of the last byte loaded will result in the complement of the
loaded data on I/O7. Once the program cycle has been completed, true data is valid on all out-
puts and the next cycle may begin. DATA polling may begin at any time during the program
cycle.
In addition to DATA polling the AT29LV256 provides another method for determining the end
of a program or erase cycle. During a program or erase operation, successive attempts to
read data from the device will result in I/O6 toggling between one and zero. Once the program
cycle has completed, I/O6 will stop toggling and valid data will be read. Examining the toggle
bit may begin at any time during a program cycle.
The entire device can be erased by using a 6-byte software code. Please see Software Chip
Erase application note for details.
CC
+ 0.6V
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent dam-
age to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
AT29LV256
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