SI3216-C-FM Silicon Laboratories Inc, SI3216-C-FM Datasheet - Page 4
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SI3216-C-FM
Manufacturer Part Number
SI3216-C-FM
Description
IC SLIC/CODEC 1CH 38QFN
Manufacturer
Silicon Laboratories Inc
Series
ProSLIC®r
Datasheet
1.SI3216-C-FT.pdf
(122 pages)
Specifications of SI3216-C-FM
Package / Case
*
Function
Subscriber Line Interface Concept (SLIC), CODEC
Interface
PCM, SPI
Number Of Circuits
1
Voltage - Supply
3.13 V ~ 5.25 V
Current - Supply
88mA
Power (watts)
700mW
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Includes
Audio Tone Generation, BORSCHT Functions, FSK Generation, Ringing and Battery Voltage Generation
Product
SLIC
Supply Voltage (min)
3.13 V
Supply Current
88 mA
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Number Of Channels
1
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Part Number:
SI3216-C-FM
Manufacturer:
SILICON LABS/芯科
Quantity:
20 000
Part Number:
SI3216-C-FMR
Manufacturer:
SILICON LABS/芯科
Quantity:
20 000
Table 1. Absolute Maximum Ratings and Thermal Information
Si3216
1. Electrical Specifications
4
Parameter
DC Supply Voltage
Input Current, Digital Input Pins
Digital Input Voltage
Operating Temperature Range
Storage Temperature Range
TSSOP-38 Thermal Resistance, Typical
QFN-38 Thermal Resistance, Typical
Continuous Power Dissipation
DC Supply Voltage
Battery Supply Voltage
Input Voltage: TIP, RING, SRINGE, STIPE pins
Input Voltage: ITIPP, ITIPN, IRINGP, IRINGN pins
Operating Temperature Range
Storage Temperature Range
SOIC-16 Thermal Resistance, Typical
Continuous Power Dissipation
Notes:
1. Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation should be
2. Operation above 125
3. Thermal resistance assumes a multi-layer PCB with the exposed pad soldered to a topside PCB pad.
restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
º
C junction temperature may degrade device reliability.
2
2
2
2
3
V
Rev. 1.0
Si3216
DDD
Si3201
, V
Symbol
V
T
V
T
V
DDA1
V
V
P
INHV
P
I
T
STG
T
STG
BAT
IND
IN
JA
JA
DD
JA
IN
A
D
A
D
, V
DDA2
1
(V
BAT
–0.3 to (V
–0.3 to (V
– 0.3) to (V
0.8 at 70 ºC
0.6 at 85 ºC
–0.5 to 6.0
–40 to 100
–40 to 150
–0.5 to 6.0
–40 to 100
–40 to 150
Value
–104
±10
0.7
70
35
55
DDD
DD
+ 0.3)
+ 0.3)
DD
+ 0.3)
Unit
C/W
C/W
C/W
mA
W
W
C
C
C
C
V
V
V
V
V
V