NOIL1SE3000A-GDC ON Semiconductor, NOIL1SE3000A-GDC Datasheet - Page 20
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NOIL1SE3000A-GDC
Manufacturer Part Number
NOIL1SE3000A-GDC
Description
Manufacturer
ON Semiconductor
Datasheet
1.NOIL1SE3000A-GDC.pdf
(58 pages)
Specifications of NOIL1SE3000A-GDC
Lead Free Status / Rohs Status
Supplier Unconfirmed
Detailed Description of Internal Registers
RESET_N is low. When the chip is not in reset, all registers
are written and read through the SPI. The registers are
written when the on-chip sequencer is in reset
(RESET_N_SEQ bit is low). Resetting the sequencer has no
influence on the SPI registers.
this influences image characteristics such as black level or
interrupts readout. To avoid this, change registers at the
appropriate moment during operation.
are changed during the FOT (when FOT pin is high).
Registers that are used for pixel timing are changed outside
the FOT (when FOT pin is low). Change SPI registers when
the RESET_N_SEQ bit is low.
Table 15. DETAILED DESCRIPTION OF SPI REGISTERS
All registers are reset to their default value when
Registers are written during normal operation. However,
Registers that control the readout and reference voltages
Address
101
102
103
104
105
106
107
108
109
120
121
122
123
124
125
126
127
110
111
112
113
114
115
116
117
118
119
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
<7:0>
Bits
Testpattern 5
Testpattern 6
Testpattern 7
Testpattern 8
Testpattern 9
Testpattern 10
Testpattern 11
Testpattern 12
Testpattern 13
Testpattern 14
Testpattern 15
Testpattern 16
Testpattern 17
Testpattern 18
Testpattern 19
Testpattern 20
Testpattern 21
Testpattern 22
Testpattern 23
Testpattern 24
Testpattern 25
Testpattern 26
Testpattern 27
Testpattern 28
Testpattern 29
Testpattern 30
Testpattern 31
Name
http://onsemi.com
20
SPI Registers
Sequencer Register (b0000000 / d0)
analog core and the different modes of the sequencer. Bits
<7:6> are ignored. The sequencer register contains several
sub registers.
•
•
•
Test pattern for channel 5
Test pattern for channel 6
Test pattern for channel 7
Test pattern for channel 8
Test pattern for channel 9
Test pattern for channel 10
Test pattern for channel 11
Test pattern for channel 12
Test pattern for channel 13
Test pattern for channel 14
Test pattern for channel 15
Test pattern for channel 16
Test pattern for channel 17
Test pattern for channel 18
Test pattern for channel 19
Test pattern for channel 20
Test pattern for channel 21
Test pattern for channel 22
Test pattern for channel 23
Test pattern for channel 24
Test pattern for channel 25
Test pattern for channel 26
Test pattern for channel 27
Test pattern for channel 28
Test pattern for channel 29
Test pattern for channel 30
Test pattern for channel 31
The sequencer register controls the power down of the
Powerdown, bit <0>. Setting this bit high brings the
image core in power down mode. It shuts down all
analog amplifiers.
Reset_n_seq, bit<1>. Bringing this bit low resets the
on-chip sequencer. This allows interruption of light
integration and readout. Bringing the bit high triggers a
new readout and integration cycle in the sequencer.
Red_ROT, bit<2>. Setting this bit activates the
reduced ROT mode. This mode allows increasing the
frame rate at a possibly reduced dynamic range. The
reduction in dynamic range depends on the length of
Description