5962-8753902LA E2V, 5962-8753902LA Datasheet - Page 14

• Manufacturer Part Number: 5962-8753902LA
• Manufacturer: E2V

Specifications of 5962-8753902LA

• Lead Free Status / Rohs Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
4.3.2 Groups C and D inspections.
a.
b.
c.
d.
e.
a.
b.
(1)
DEFENSE SUPPLY CENTER COLUMBUS
Tests shall be as specified in table II herein.
Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
Subgroup 4 (C
changes which may affect input capacitance. Sample size is 15 devices with no failures, and all input and output
terminals tested.
All devices submitted for testing shall be programmed in accordance with 3.2.3.1 or 3.2.3.2 herein or at the
manufacturer's option; built-in test circuitry may be used to verify programmability and ac performance without
programming the user array. After completion of all testing, the devices shall be erased and verified except devices
submitted to groups C and D testing.
Subgroups 7, 8A, and 8B shall include verification of the truth table.
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
MICROCIRCUIT DRAWING
Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method
1005 of MIL-STD-883.
COLUMBUS, OHIO 43218-3990
STANDARD
IN
and C
Interim electrical parameters
Final electrical test parameters
Group A test requirements
Groups C and D end-point
MIL-STD-883 test requirements
OUT
(method 5004)
(method 5004)
(method 5005)
electrical parameters
(method 5005)
1/ * indicates PDA applies to subgroups 1 and 7.
2/ Any or all subgroups may be combined when using
3/ ** see 4.3.1c.
4/ Subgroups 7, 8A, and 8B, functional tests shall also verify
no cells are programmed for unprogrammed devices or the
altered item drawing pattern exists for programmed devices.
measurement) shall be measured only for the initial test and after process or design
high-speed testers.
TABLE II. Electrical test requirements.
1
1*,2, 3, 7*, 8A, 8B, 9
1, 2, 3, 4**, 7, 8A, 8B,
9, 10, 11
2, 3, 7, 8A, or 2, 8A, 10
MIL-STD-883, method 5005,
SIZE
A
(in accordance with
Subgroups
table I)
REVISION LEVEL
L
SHEET
5962-87539
14