SAM7S16 Atmel Corporation, SAM7S16 Datasheet - Page 236
![no-image](/images/manufacturer_photos/0/0/79/atmel_corporation_sml.jpg)
SAM7S16
Manufacturer Part Number
SAM7S16
Description
Manufacturer
Atmel Corporation
Specifications of SAM7S16
Flash (kbytes)
16 Kbytes
Pin Count
48
Max. Operating Frequency
55 MHz
Cpu
ARM7TDMI
Hardware Qtouch Acquisition
No
Max I/o Pins
21
Ext Interrupts
21
Usb Speed
No
Usb Interface
No
Spi
1
Twi (i2c)
1
Uart
2
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
4
Self Program Memory
NO
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
3.0 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
- Current page: 236 of 284
- Download datasheet (2Mb)
Debug in Depth
B-18
•
The scan cells are not fully JTAG-compliant in that they do not have an update stage.
Therefore, while data is being moved around the scan chain, the contents of the scan cell
are not isolated from the output. From these operations, the output from the scan cell to
the core or to the external system can change on every scan clock. This does not affect
the ARM7TDMI core because its internal state does not change until it is clocked.
However, the rest of the system must be aware that every output can change
asynchronously as data is moved around the scan chain. External logic must ensure that
this does not harm the rest of the system.
Scan chain 0
Scan chain 0 is intended primarily for inter-device testing, EXTEST, and testing the
core, INTEST. Scan chain 0 is selected using the SCAN_N instruction as described at
SCAN_N (0010) on page B-10.
INTEST enables serial testing of the core. The TAP controller must be placed in
INTEST mode after scan chain 0 has been selected:
•
•
•
For a description of the core clocks during test and debug, see The ARM7TDMI core
clocks on page B-22.
EXTEST enables inter-device testing, useful for verifying the connections between
devices on a circuit board. The TAP controller must be placed in EXTEST mode after
scan chain 0 has been selected:
•
•
In SYSTEM mode, the scan cells are idle. System data is applied to inputs and
core outputs are applied to the system.
During CAPTURE-DR, the current outputs from the core logic are captured in the
output cells.
During SHIFT-DR, this captured data is shifted out while a new serial test pattern
is scanned in, therefore applying known stimuli to the inputs.
During RUN-TEST-IDLE, the core is clocked. Usually, the TAP controller only
spends one cycle in RUN-TEST-IDLE. The whole operation can then be repeated.
During CAPTURE-DR, the current inputs to the core logic from the system are
captured in the input cells.
During SHIFT-DR, this captured data is shifted out while a new serial test pattern
is scanned in, thus applying known values on the outputs of the core.
Note
Copyright © 1994-2001. All rights reserved.
ARM DDI 0029G
Related parts for SAM7S16
Image
Part Number
Description
Manufacturer
Datasheet
Request
R
![U641B](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
INTERVAL AND WIPE/WASH WIPER CONTROL IC WITH DELAY
Manufacturer:
ATMEL Corporation
Datasheet:
![U4082B](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
Low-Voltage Voice-Switched IC for Hands-Free Operation
Manufacturer:
ATMEL Corporation
Datasheet:
![U4089B](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
MONOLITHIC INTEGRATED FEATUREPHONE CIRCUIT
Manufacturer:
ATMEL Corporation
Datasheet:
![U4255BM-M](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
AM-FM Receiver IC U4255BM-M
Manufacturer:
ATMEL Corporation
Datasheet:
![U4089B-P](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
Monolithic Integrated Feature Phone Circuit
Manufacturer:
ATMEL Corporation
Datasheet:
![TDA4470](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
Multistandard Video-IF and Quasi Parallel Sound Processing
Manufacturer:
ATMEL Corporation
Datasheet:
![ATF22V10B-25PC](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
High-performance EE PLD
Manufacturer:
ATMEL Corporation
Datasheet:
![AT89C51ED2-IM](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
8-bit Flash Microcontroller
Manufacturer:
ATMEL Corporation
Datasheet:
![AT24C01](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
2-Wire Serial EEPROM
Manufacturer:
ATMEL Corporation
Datasheet:
![U6046B](/images/manufacturer_photos/0/0/79/atmel_corporation_tmb.jpg)
Part Number:
Description:
U6046BREAR WINDOW HEATING TIMER / LONG-TERM TIMER
Manufacturer:
ATMEL Corporation
Datasheet: