FSL13A0R Intersil Corporation, FSL13A0R Datasheet

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FSL13A0R

Manufacturer Part Number
FSL13A0R
Description
9a, 100v, 0.180 Ohm, Rad Hard, Segr Resistant, N-channel Power Mosfets
Manufacturer
Intersil Corporation
Datasheet
9A, 100V, 0.180 Ohm, Rad Hard, SEGR
Resistant, N-Channel Power MOSFETs
The Discrete Products Operation of Intersil has developed a
series of Radiation Hardened MOSFETs specifically
designed for commercial and military space applications.
Enhanced Power MOSFET immunity to Single Event Effects
(SEE), Single Event Gate Rupture (SEGR) in particular, is
combined with 100K RADS of total dose hardness to provide
devices which are ideally suited to harsh space
environments. The dose rate and neutron tolerance
necessary for military applications have not been sacrificed.
The Intersil portfolio of SEGR resistant radiation hardened
MOSFETs includes N-Channel and P-Channel devices in a
variety of voltage, current and on-resistance ratings.
Numerous packaging options are also available.
This MOSFET is an enhancement-mode silicon-gate power
field-effect transistor of the vertical DMOS (VDMOS)
structure. It is specially designed and processed to be
radiation tolerant. The MOSFET is well suited for
applications exposed to radiation environments such as
switching regulation, switching converters, motor drives,
relay drivers and drivers for high-power bipolar switching
transistors requiring high speed and low gate drive power.
This type can be operated directly from integrated circuits.
Reliability screening is available as either commercial, TXV
equivalent of MIL-S-19500, or Space equivalent of
MIL-S-19500. Contact Intersil for any desired deviations
from the data sheet.
Ordering Information
Formerly available as type TA17696.
10K
10K
100K
100K
100K
RAD LEVEL
Commercial
TXV
Commercial
TXV
Space
SCREENING LEVEL PART NUMBER/BRAND
4-1
Data Sheet
FSL13A0D1
FSL13A0D3
FSL13A0R1
FSL13A0R3
FSL13A0R4
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
Features
• 9A, 100V, r
• Total Dose
• Single Event
• Dose Rate
• Photo Current
• Neutron
Symbol
Package
- Meets Pre-RAD Specifications to 100K RAD (Si)
- Safe Operating Area Curve for Single Event Effects
- SEE Immunity for LET of 36MeV/mg/cm
- Typically Survives 3E9 RAD (Si)/s at 80% BV
- Typically Survives 2E12 if Current Limited to I
- 1.5nA Per-RAD(Si)/s Typically
- Maintain Pre-RAD Specifications
- Usable to 3E14 Neutrons/cm
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 2000
V
V
for 3E13 Neutrons/cm
DS
GS
up to 80% of Rated Breakdown and
of 10V Off-Bias
June 1999
DS(ON)
FSL13A0D, FSL13A0R
= 0.180
G
TO-205AF
2
D
G
S
File Number
2
D
S
2
with
DSS
DM
4480.2

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FSL13A0R Summary of contents

Page 1

... FSL13A0R1 100K TXV FSL13A0R3 100K Space FSL13A0R4 Formerly available as type TA17696. 4-1 FSL13A0D, FSL13A0R June 1999 Features • 9A, 100V, r DS(ON) • Total Dose - Meets Pre-RAD Specifications to 100K RAD (Si) • Single Event - Safe Operating Area Curve for Single Event Effects - SEE Immunity for LET of 36MeV/mg/cm ...

Page 2

... g(TH 9A 15V (PLATEAU 25V 0V 1MHz ISS OSS C RSS FSL13A0D, FSL13A0R 100 DS 100 DGR 0. -55 to 150 J STG 300 L MIN TYP 100 ...

Page 3

... FLUENCE = 1E5 IONS/cm (TYPICAL) 100 TEMP = -10 -15 V (V) GS FIGURE 1. SINGLE EVENT EFFECTS SAFE OPERATING AREA 4-3 FSL13A0D, FSL13A0R TEST CONDITIONS 9A, dI /dt = 100A Unless Otherwise Specified C SYMBOL TEST CONDITIONS BV V ...

Page 4

... BASIC GATE CHARGE WAVEFORM FIGURE 5. BASIC GATE CHARGE WAVEFORM 10 1 0.5 0.2 0.1 0.1 0.05 0.02 0.01 SINGLE PULSE 0.01 0.001 - FIGURE 7. NORMALIZED MAXIMUM TRANSIENT THERMAL RESPONSE 4-4 FSL13A0D, FSL13A0R Unless Otherwise Specified (Continued) 100 10 1 0.1 100 150 FIGURE 4. FORWARD BIAS SAFE OPERATING AREA 2.5 2.0 1.5 1.0 0.5 0.0 -80 FIGURE 6. NORMALIZED r ...

Page 5

... TO OBTAIN P 50 REQUIRED PEAK 20V FIGURE 9. UNCLAMPED ENERGY TEST CIRCUIT V = 12V FIGURE 11. RESISTIVE SWITCHING TEST CIRCUIT 4-5 FSL13A0D, FSL13A0R Unless Otherwise Specified (Continued) 50 STARTING STARTING T = 150 ( (1.3 RATED DSS ...

Page 6

... Bias (Drain Stress) PDA Final Electrical Tests (Note 9) NOTE: 9. Test limits are identical pre and post burn-in. Additional Screening Tests PARAMETER Safe Operating Area Unclamped Inductive Switching Thermal Response Thermal Impedance 4-6 FSL13A0D, FSL13A0R SYMBOL TEST CONDITIONS 20V GSS ...

Page 7

... Intermittent Operating Life (Subgroup C6) - Bond Strength Data (Subgroup C6) G. Group D - Attributes Data Sheet - Group D Lot Traveler - Pre and Post RAD Read and Record Data 4-7 FSL13A0D, FSL13A0R Class S - Equivalents 1. RAD HARD “S” EQUIVALENT - STANDARD DATA PACKAGE A. Certificate of Compliance B. Serialization Records C. Assembly Flow Chart D ...

Page 8

... For information regarding Intersil Corporation and its products, see web site www.intersil.com Sales Office Headquarters NORTH AMERICA Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (321) 724-7000 FAX: (321) 724-7240 4-8 FSL13A0D, FSL13A0R SYMBOL P A Øb SEATING ØD PLANE ØD ...

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