MACHLV210 Lattice Semiconductor Corp., MACHLV210 Datasheet - Page 21

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MACHLV210

Manufacturer Part Number
MACHLV210
Description
High Density Ee Cmos Programmable Logic
Manufacturer
Lattice Semiconductor Corp.
Datasheet

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ENDURANCE CHARACTERISTICS
The MACHLV210 is manufactured using our ad-
vanced Electrically Erasable process. This technology
uses an EE cell to replace the fuse link used in bipolar
INPUT/OUTPUT EQUIVALENT SCHEMATICS
Parameter
Symbol
t
DR
N
Min Pattern Data Retention Time
Parameter Description
Max Reprogramming Cycles
Protection
ESD
MACHLV210-12/15/20
>50 k
Test Conditions
Max Storage
Temperature
Max Operating
Temperature
Normal Programming
Conditions
Program/Verify
Output
Circuitry
Input
Circuitry
V
Preload
CC
parts. As a result, the device can be erased and
reprogrammed, a feature which allows 100% testing at
the factory.
Feedback
Input
>50 k
V
CC
Min
100
10
20
Cycles
Years
Years
17908D-9
Unit
21

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