AT91F40416 ATMEL Corporation, AT91F40416 Datasheet - Page 2

• Manufacturer Part Number: AT91F40416
• Description: At91 Arm(r) Thumb(r) Microcontroller
• Manufacturer: ATMEL Corporation

Figure 1. RTC Pin Configuration
Table 1. Pin Description
2
Pin Name
cp2
ireset
dbus_in[7:0]
dbus_out[7:0]
out_en
cs
adr
iore
iowe
RTC
clk32768
IRQ
rtc_int
Scan Test
test_mode
test_si
test_so
test_se
RTC
Description
CPU clock
Synchronous reset
Data bus input
Data bus output
Output enable strobe
Chip Select
I/O address input
I/O read strobe
I/O write strobe
Main clock for RTC
Interrupt
Clock selection for test
purposes
Test scan inputs
Test scan outputs
Test scan enable
AVR Control
Scan Test
RTC
dbus_in[7:0]
test_mode
clk32768
test_se
test_si
ireset
iowe
iore
cp2
adr
cs
Direction
Output
Output
Output
Output
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
Input
AVR Control
RTC
Comments
Any register in the RTC will update its contents only on the
positive edge of cp2.
When high, ireset will reset internal registers by reading the value
on dbus_in which is forced to zero by the AVR Core.
Valid only when out_en is high.
When high, out_en indicates that the RTC requires control of the
data bus.
When high, adr, iore and iowe are used to access internal RTC
I/Os. When low, the RTC cannot be accessed in either read or
write mode.
Connects to LSB of AVR adr[5:0] bus. Valid only when
accompanied by a strobe on iore or iowe.
Used to read the contents of the I/O location addressed by adr.
Active high.
Used to update the contents of the I/O location addressed by adr.
Active high.
F = 32.768 kHz (Crystal oscillator).
Programmable from alarm and/or event. Active high.
All flip-flops are driven with the same clock (clk32768). Active
high/low.
Input of scan chain.
Output of scan chain.
Scan shift/scan capture.
dbus_out[7:0]
out_en
rtc_int
test_so
AVR Control
IRQ
Scan Test
1302B–07/01