HCTS10D Intersil Corporation, HCTS10D Datasheet - Page 5

• Manufacturer Part Number: HCTS10D
• Description: Radiation Hardened Triple 3-Input NAND Gate
• Manufacturer: Intersil Corporation

NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
2. Each pin except VCC and GND will have a resistor of 1K
STATIC BURN-IN I TEST CONDITIONS (Note 1)
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2)
6, 8, 12
6, 8, 12
OPEN
-
NOTE: Each pin except VCC and GND will have a resistor of 47K
1, 2, 3, 4, 5, 7, 9, 10, 11,
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
6, 8, 12
OPEN
GROUND
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
13
7
7
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCTS10MS
1/2 VCC = 3V 0.5V
GROUND
6, 8, 12
7
-
-
5% for dynamic burn-in.
5% for static burn-in.
5
1, 2, 3, 4, 5, 9, 10,
VCC = 6V
11, 13, 14
1, 2, 3, 4, 5, 9, 10, 11, 13, 14
14
14
VCC = 5V
0.5V
5% for irradiation testing.
0.5V
1, 2, 3, 4, 5, 9,
10, 11, 13
50kHz
-
-
OSCILLATOR
Spec Number
25kHz
-
-
-
518778