SGA-8343X Stanford Microdevices, SGA-8343X Datasheet - Page 7
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SGA-8343X
Manufacturer Part Number
SGA-8343X
Description
Reliability Qualification Report
Manufacturer
Stanford Microdevices
Datasheet
1.SGA-8343X.pdf
(9 pages)
Test Conditions
Number of
Devices Under
Test
Test Conditions
Number of
Devices Under
Test
Group J
Group K
(1)
1 device removed for improper assembly. See CAR number 350; Reference FA04032.
SGA-8343X Reliability Qualification Report
Tin Whiskering Biased
Temperature 51°C/85% humidity. Test Duration 1000 hours.
15
Tin Whiskering Unbiased
Temperature 51°C/85% humidity. Test Duration 1000 hours.
15
Test
Standard
Test
Standard
SMDI Internal
SMDI Internal
Results
Results
PASS
PASS