MX29LV004B Macronix, MX29LV004B Datasheet - Page 20

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MX29LV004B

Manufacturer Part Number
MX29LV004B
Description
4M-Bit CMOS Single Voltage 3V Only Flash Memory
Manufacturer
Macronix
Datasheet

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AC CHARACTERISTICS
Table 10. READ OPERATIONS
TEST CONDITIONS:
• Input pulse levels: 0V/3.0V.
• Input rise and fall times is equal to or less than 5ns.
• Output load: 1 TTL gate + 100pF (Including scope and
• Reference levels for measuring timing: 1.5V.
P/N:PM0732
SYMBOL PARAMETER
tRC
tACC
tCE
tOE
tDF
tOEH
tOH
jig), for 29LV004T/B-90. 1 TTL gate + 30pF (Including
scope and jig) for 29LV004T/B-70 & 29LV004T/B-55R.
Address to Output Delay
Read Cycle Time (Note 1)
CE# to Output Delay
OE# to Output Delay
OE# High to Output Float (Note1) 0
Output Enable Read
Hold Time
Address to Output hold
Toggle and
Data# Polling
TA = -40
(TA = 0
o
C to 70
o
29LV004T/B-55R 29LV004T/B-70 29LV004T/B-90
MIN.
55
0
10
0
C to 85
o
C, VCC = 3.3V 5% for MX29LV004T/B-55R)
MAX.
55
55
30
25
o
C, VCC = 2.7V~3.6V
20
NOTE:
1. Not 100% tested.
2. tDF is defined as the time at which the output achieves
MIN.
70
0
10
0
0
the open circuit condition and data is no longer driven.
MAX.
70
70
30
25
MX29LV004T/B
90
MIN.
0
0
10
0
MAX.
90
90
35
30
UNIT CONDITIONS
ns
ns
ns
ns
ns
ns
ns
ns
REV. 1.7, DEC. 20, 2004
OE#=VIL
CE#=OE#=VIL
CE#=VIL
CE#=VIL
CE#=OE#=VIL

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