BT136B-500E NXP Semiconductors, BT136B-500E Datasheet - Page 4
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BT136B-500E
Manufacturer Part Number
BT136B-500E
Description
Triacs Sensitive Gate
Manufacturer
NXP Semiconductors
Datasheet
1.BT136B-500E.pdf
(6 pages)
Philips Semiconductors
March 1997
Triacs
sensitive gate
Fig.8. Normalised latching current I
Fig.9. Normalised holding current I
2.5
1.5
0.5
2.5
1.5
0.5
I
GT
3
2
1
0
2.5
1.5
0.5
3
2
1
0
-50
-50
(T
3
2
1
0
IGT(25 C)
IL(25 C)
-50
IGT(Tj)
IL(Tj)
IH(25C)
IH(Tj)
Fig.7. Normalised gate trigger current
j
)/ I
GT
versus junction temperature T
versus junction temperature T
(25˚C), versus junction temperature T
0
0
0
BT136E
TRIAC
TRIAC
Tj / C
Tj / C
Tj / C
50
50
50
100
T2+ G-
T2- G-
100
100
T2+ G+
T2- G+
H
L
(T
(T
j
j
)/ I
)/ I
j
j
.
.
H
L
(25˚C),
(25˚C),
150
150
150
j
.
4
Fig.12. Typical, critical rate of rise of off-state voltage,
Fig.10. Typical and maximum on-state characteristic.
Fig.11. Transient thermal impedance Z
1000
100
12
10
0.01
10
8
6
4
2
0
0.1
1
10
0
10us
IT / A
1
0
dVD/dt (V/us)
Rs = 0.091 ohms
dV
Tj = 125 C
Zth j-mb (K/W)
Vo = 1.27 V
Tj = 25 C
D
/dt versus junction temperature T
0.5
0.1ms
pulse width t
1ms
1
50
BT136
VT / V
tp / s
BT136
10ms
Tj / C
1.5
typ
BT136B series E
P
D
p
0.1s
.
100
Product specification
2
t
p
unidirectional
bidirectional
max
1s
2.5
th j-mb
t
Rev 1.000
, versus
j
.
10s
150
3