sl13-n FORMOSA MICROSEMI CO. LTD, sl13-n Datasheet - Page 7

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sl13-n

Manufacturer Part Number
sl13-n
Description
Low Vf Chip Schottky Barrier Rectifier
Manufacturer
FORMOSA MICROSEMI CO. LTD
Datasheet
High reliability test capabilities
1. Solder Resistance
2. Solderability
3. High Temperature Reverse Bias
4. Forward Operation Life
5. Intermittent Operation Life
6. Pressure Cooker
7. Temperature Cycling
8. Thermal Shock
9. Forward Surge
10. Humidity
11. High Temperature Storage Life
12. Solvent Resistance
Low VF Chip Schottky Barrier Rectifier
SL12-N THRU SL14-N
Item Test
http://www.formosams.com/
TEL:886-2-22696661
FAX:886-2-22696141
at 260±5 C for 10±2sec.
immerse body into solder 1/16"±1/32"
at 245±5 C for 5 sec.
V =80% rate at T =125 C for 168 hrs.
Rated average rectifier current at T=25 C for 500hrs.
T = 25 C, I = I
On state: power on for 5 min.
off state: power off for 5 min.
on and off for 500 cycles.
15P
-55 C to +125 C dwelled for 30 min.
and transferred for 5min. total 10 cycles.
0 C for 5 min. rise to 100 C for 5 min. total 10 cycles.
8.3ms single half sine-wave superimposed
on rated load, one surge.
at T =65 C, RH=98% for 1000hrs.
at 175 C for 1000 hrs.
Dip into Freon at 25 C for 1 min.
A
O
R
O
Conditions
A
SIG
O
at T =121 C for 4 hrs.
O
O
O
O
A
F
O
O
O
A
Page 7
O
O
O
O
Document ID
DS-121652
Formosa MS
Issued Date
2008/02/10
MIL-STD-750D
METHOD-2031
MIL-STD-202F
METHOD-208
MIL-STD-750D
METHOD-1026
MIL-STD-750D
METHOD-1027
MIL-STD-750D
METHOD-1036
MIL-STD-750D
METHOD-1051
MIL-STD-750D
METHOD-1056
MIL-STD-750D
METHOD-4066-2
MIL-STD-750D
METHOD-1038
MIL-STD-750D
METHOD-1031
MIL-STD-202F
METHOD-215
Reference
Revised Date
-
Revision
A
Page.
7

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