ep20k1000e Altera Corporation, ep20k1000e Datasheet - Page 58

• Manufacturer Part Number: ep20k1000e
• Description: Programmable Logic Device Family
• Manufacturer: Altera Corporation

APEX 20K Programmable Logic Device Family Data Sheet
Generic Testing
58
f
Table 22
devices.
For more information, see the following documents:
■
■
Each APEX 20K device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100% yield. AC test measurements for APEX 20K
devices are made under conditions equivalent to those shown in
Figure
all stages of the production flow.
Symbol
t
t
t
t
t
t
t
t
t
t
t
t
t
JCP
JCH
JCL
JPSU
JPH
JPCO
JPZX
JPXZ
JSSU
JSH
JSCO
JSZX
JSXZ
Table 22. APEX 20K JTAG Timing Parameters & Values
Application Note 39 (IEEE Std. 1149.1 (JTAG) Boundary-Scan Testing in
Altera Devices)
Jam Programming & Test Language Specification
32. Multiple test patterns can be used to configure devices during
shows the JTAG timing parameters and values for APEX 20K
TCK clock period
TCK clock high time
TCK clock low time
JTAG port setup time
JTAG port hold time
JTAG port clock to output
JTAG port high impedance to valid output
JTAG port valid output to high impedance
Capture register setup time
Capture register hold time
Update register clock to output
Update register high impedance to valid output
Update register valid output to high impedance
Parameter
Altera Corporation
Min
100
50
50
20
45
20
45
Max
25
25
25
35
35
35
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns