cat93c5612pi-45te13 Catalyst Semiconductor, cat93c5612pi-45te13 Datasheet - Page 3

• Manufacturer Part Number: cat93c5612pi-45te13
• Description: Supervisory Circuits With Microwire Serial Cmos E2prom, Precision Reset Controller Watchdog Timer
• Manufacturer: Catalyst Semiconductor

RELIABILITY CHARACTERISTICS
A.C. CHARACTERISTICS
V
Output Load is 1 TTL Gate and 100pF
Power-Up Timing
CAPACITANCE T
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) t
(3) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
Symbol
N
T
V
I
CC
LTH
DR
Symbol
C
C
ZAP
END
SYMBOL PARAMETER
t
t
t
t
t
t
t
t
t
t
t
t
SK
CSS
CSH
DIS
DIH
PD1
PD0
HZ
EW
CSMIN
SKHI
SKLOW
SV
Symbol
I/O
IN
=2.7V to 6.0V unless otherwise specified.
PUR
(1)
(1)(3)
(1)
MAX
(1)
(1)
t
t
(1)
(1)
PUR
PUW
and t
PUW
CS Setup Time
CS Hold Time
DI Setup Time
DI Hold Time
Output Delay to 1
Output Delay to 0
Output Delay to High-Z
Program/Erase Pulse Width
Minimum CS Low Time
Minimum SK High Time
Minimum SK Low Time
Output Delay to Status Valid
Maximum Clock Frequency
Endurance
Data Retention
ESD Susceptibility
Latch-up
Parameter
Test
Input/Output Capacitance
Input Capacitance
are the delays required from the time V
(1)(2)
A
= 25 C, f = 1.0 MHz, V
Power-up to Read Operation
Power-up to Write Operation
Parameter
100
1,000,000
2000
Min.
100
CC
Min.
250
250
250
0.5
0.5
0.5
DC
CC
2.7V -6V
0
= 5V
V
is stable until the specified operation can be initiated.
CC
Max.
=
Max.
1000
500
9-87
0.5
0.5
0.5
5
Cycles/Byte
mA
Units
Years
Volts
Max.
Min.
DC
0.1
0.1
0.1
8
6
50
50
50
4.5V-5.5V
0
V
CC
Limits
3000
=
Max. UNITS Conditions
100
0.1
0.1
0.1
5
Max.
Units
KHZ
1
1
pF
pF
JEDEC Standard 17
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
ms
Reference Test Method
ns
ns
ns
ns
ns
s
s
s
s
s
s
CC
+1V.
C
L
= 100pF
Test
Conditions
V
V
CAT93CXXXX
I/O
IN
Stock No. 21084-01 2/98
Units
= 0V
= 0V
ms
ms