lh28f160s5h-l Sharp Microelectronics of the Americas, lh28f160s5h-l Datasheet - Page 39
lh28f160s5h-l
Manufacturer Part Number
lh28f160s5h-l
Description
M-bit Smart Flash Memories Fast Programming
Manufacturer
Sharp Microelectronics of the Americas
Datasheet
1.LH28F160S5H-L.pdf
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6.2.4 AC CHARACTERISTICS - READ-ONLY OPERATIONS
[LH28F160S5-L]
NOTES :
1. See AC Input/Output Reference Waveform (Fig. 12 and
2. OE# may be delayed up to t
3. Sampled, not 100% tested.
4. See Fig. 12 "Transient Input/Output Reference
SYMBOL
• V
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
AVAV
AVQV
ELQV
PHQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
OH
FLQV
FHQV
FLQZ
ELFL
ELFH
CC
Fig. 13) for maximum allowable input slew rate.
edge of CE# without impact on t
Waveform" and Fig. 14 "Transient Equivalent Testing
Load Circuit" (High Speed Configuration) for testing
characteristics.
= 5.0±0.25 V, 5.0±0.5V, T
Read Cycle Time
Address to Output Delay
CE# to Output Delay
RP# High to Output Delay
OE# to Output Delay
CE# to Output in Low Z
CE# High to Output in High Z
OE# to Output in Low Z
OE# High to Output in High Z
Output Hold from Address,
CE# or OE# Change,
Whichever Occurs First
BYTE# to Output Delay
BYTE# to Output in High Z
CE# Low to BYTE#
High or Low
VERSIONS
PARAMETER
ELQV
A
ELQV
-t
= 0 to +70°C
GLQV
.
V
V
CC
CC
after the falling
±0.25 V
±0.5 V
NOTE
2
2
3
3
3
3
3
3
3
3
(NOTE 4)
LH28F160S5-L70
MIN.
70
- 39 -
0
0
0
5. See Fig. 13 "Transient Input/Output Reference
MAX.
400
70
70
30
25
10
70
25
5
Waveform" and Fig. 14 "Transient Equivalent Testing
Load Circuit" (Standard Configuration) for testing
characteristics.
(NOTE 5)
LH28F160S5-L70
MIN.
(NOTE1)
80
0
0
0
MAX.
400
80
80
35
30
80
30
10
5
LH28F160S5-L/S5H-L
(NOTE 5)
LH28F160S5-L10
MIN.
100
0
0
0
MAX.
100
100
400
100
40
35
15
30
5
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
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