lh28f004su-z9 Sharp Microelectronics of the Americas, lh28f004su-z9 Datasheet - Page 18

• Manufacturer Part Number: lh28f004su-z9
• Description: Flash Memory
• Manufacturer: Sharp Microelectronics of the Americas

LH28F004SU-Z9
Timing Nomenclature
For 3.3 V systems use 1.5 V cross point definitions.
Each timing parameter consists of 5 characters. Some common examples are defined below:
t
t
t
t
t
18
CE
OE
ACC
AS
DH
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1'
and 0.0 V for a Logic '0'. Input timing begins,
and output timing ends at 1.5 V. Input rise
and fall times (10% to 90%) < 10 ns.
3 V
3.0
0.0
W
Q
G
A
D
E
P
R
V
INPUT
t
t
t
t
t
ELQV
GLQV
AVQV
AVWH
WHDX
Address Inputs
Data Inputs
Data Outputs
CE
OE
WE (Write Enable)
RP
RY
Any Voltage Level
V
Figure 13. Transient Input/Output
Reference Waveform (V
CC
1.5
»
»
»
/ BY
»
(Chip Enable)
(Deep Power-Down Pin)
(Output Enable)
at 3.0 V Min.
time (t) from CE
time (t) from OE
time (t) from address (A) valid (V) to the outputs (Q) becoming valid (V)
time (t) from address (A) valid (V) to WE
time (t) from WE
PIN CHARACTERS
»
(Ready/Busy)
TEST POINTS
»
»
»
(E) going low (L) to the outputs (Q) becoming valid (V)
(G) going low (L) to the outputs (Q) becoming valid (V)
(W) going high (H) to when the data (D) can become undefined (X)
CC
= 3.3 V)
H
L
V
X
Z
1.5
28F004SU-Z9-13
OUTPUT
High
Low
Valid
Driven, but not necessarily valid
High Impedance
»
(W) going high (H)
PIN STATES
FROM OUTPUT
UNDER TEST
Figure 14. Transient Equivalent Testing
Load Circuit (V
2.5 ns OF 50
TOTAL CAPACITANCE = 50 pF
4M (512K × 8) Flash Memory
CC
TRANSMISSION LINE
= 3.3 V)
28F004SU-Z9-14
POINT
TEST