x9530 Intersil Corporation, x9530 Datasheet - Page 26
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x9530
Manufacturer Part Number
x9530
Description
Temperature Compensated Laser Diode Controller
Manufacturer
Intersil Corporation
Datasheet
1.X9530.pdf
(28 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
x9530V14I
Manufacturer:
Intersil
Quantity:
270
2-WIRE INTERFACE A.C. CHARACTERISTICS
2-WIRE INTERFACE TEST CONDITIONS
NONVOLATILE WRITE CYCLE TIMING
Notes: 1. Cb = total capacitance of one bus line (SDA or SCL) in pF.
f
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
Cb
Input Pulse Levels
Input Rise and Fall Times, between 10% and 90%
Input and Output Timing Threshold Level
External Load at pin SDA
Symbol
t
Symbol
SCL
IN
AA
BUF
LOW
HIGH
SU:STA
HD:STA
SU:DAT
HD:DAT
SU:STO
DH
R
F
SU:WP
HD:WP
WC
(4)
(4)
(4)
(4)
(4)
(2)
(4)
(4)
2. t
3. The minimum frequency requirement applies between a START and a STOP condition.
4. These parameters are periodically sampled and not 100% tested.
(4)
is the minimum cycle time to be allowed for any nonvolatile write by the user, unless Acknowledge Polling is used.
WC
Nonvolatile Write Cycle Time
is the time from a valid STOP condition at the end of a write sequence to the end of the self-timed internal nonvolatile write cycle. It
SCL Clock Frequency
Pulse width Suppression Time at
inputs
SCL Low to SDA Data Out Valid
Time the bus free before start of new
transmission
Clock Low Time
Clock High Time
Start Condition Setup Time
Start Condition Hold Time
Data In Setup Time
Data In Hold Time
Stop Condition Setup Time
Data Output Hold Time
SDA and SCL Rise Time
SDA and SCL Fall Time
WP Setup Time
WP Hold Time
Capacitive load for each bus line
Parameter
26
Parameter
Min
+0.1Cb
+0.1Cb
1300
X9530
Min
600
600
100
600
600
600
1
1.3
0.6
50
20
20
0
(3)
Typ
5
(1)
(1)
Typ
Max
10
1200
1200
Max
400
900
300
300
400
50
(3)
(3)
10 % to 90 % of Vcc
10 ns
1.4V
2.3 k
Units
ms
Units
Ω to Vcc and 100 pF to Vss
kHz
ns
ns
ns
μs
μs
ns
ns
ns
μs
ns
ns
ns
ns
ns
ns
pF
Test Conditions / Notes
Test Conditions / Notes
See “2-Wire Interface Test
See Figure 22, Figure 23
Conditions” (below),
See Figure 24
and Figure 24.
November 11, 2005
FN8211.1