hcs157ms Intersil Corporation, hcs157ms Datasheet

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hcs157ms

Manufacturer Part Number
hcs157ms
Description
Radiation Hardened Quad 2-input Multiplexers
Manufacturer
Intersil Corporation
Datasheet
September 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
• Input Current Levels Ii
Description
The Intersil HCS157MS is a Radiation Hardened quad 2-input
multiplexers which select four bits of data from two sources under
the control of a common select input (S). The Enable input (E
NOT) is active low. When the enable pin is high all of the outputs
(1Y-4Y) are forced low regardless of all other input conditions.
Moving data from two groups of registers to four common output
busses is a common use of these devices. The state of the Select
input determines the particular register from which the data comes.
They can also be used as function generators.
The HCS157MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of radia-
tion hardened, high-speed, CMOS/SOS Logic Family.
The HCS157MS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
HCS157DMSR
HCS157KMSR
HCS157D/Sample
HCS157K/Sample
HCS157HMSR
(Typ)
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
PART NUMBER
10
RAD (Si)/s, 20ns Pulse
5 A at VOL, VOH
TEMPERATURE RANGE
12
o
C to +125
-55
-55
RAD (Si)/s
o
o
C to +125
C to +125
+25
+25
+25
o
o
o
o
C
C
C
-9
C
2
/mg
Errors/Bit-Day
o
o
C
C
173
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
SCREENING LEVEL
Pinouts
GND
HCS157MS
1I0
1I1
2I0
2I1
1Y
2Y
S
MIL-STD-1835 CDFP4-F16, LEAD FINISH C
MIL-STD-1835 CDIP2-T16, LEAD FINISH C
FLATPACK PACKAGE (FLATPACK)
16 LEAD CERAMIC DUAL-IN-LINE
16 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
GND
Quad 2-Input Multiplexers
1I0
1I1
2I0
2I1
1Y
2Y
S
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
TOP VIEW
TOP VIEW
Radiation Hardened
16 Lead SBDIP
16 Lead Ceramic Flatpack
16 Lead SBDIP
16 Lead Ceramic Flatpack
Die
Spec Number
16
15
14
13
12
11
10
9
File Number
PACKAGE
16
15
14
13
12
11
10
9
VCC
E
4I0
4I1
4Y
3I0
3I1
3Y
518833
3561.1
VCC
E
4I0
4I1
4Y
3I0
3I1
3Y

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hcs157ms Summary of contents

Page 1

... They can also be used as function generators. The HCS157MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radia- tion hardened, high-speed, CMOS/SOS Logic Family. The HCS157MS is supplied lead Ceramic flatpack (K suffi SBDIP Package (D suffix). Ordering Information PART NUMBER ...

Page 2

... E 13 4I1 14 4I0 10 3I1 11 3I0 6 2I1 5 2I0 3 1I1 2 1I0 ENABLE High Level L = Low Level X = Immaterial HCS157MS 3 CIRCUITS IDENTICAL TO CIRCUIT IN ABOVE DASHED OUTLINE TRUTH TABLE SELECT INPUTS DATA INPUTS 174 ...

Page 3

... VIL = 1.35V, (Note 3) NOTES: 1. All voltages referenced to device GND. 2. Force/Measure functions may be interchanged. 3. For functional tests, VO 4.0V is recognized as a logic “1”, and VO Specifications HCS157MS Reliability Information Thermal Resistance SBDIP Package 10mA Ceramic Flatpack Package . . . . . . . . . . . ...

Page 4

... The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics. Specifications HCS157MS GROUP (NOTES 1, 2) ...

Page 5

... AC measurements assume RL = 500 , CL = 50pF, Input 3ns, VIL = GND, VIH = VCC. 3. For functional tests VO 4.0V is recognized as a logic “1”, and VO TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25 PARAMETER ICC IOL/IOH Specifications HCS157MS (NOTES 1, 2) CONDITIONS VCC = 5.5V, VIN = VCC or GND VCC = 4.5V, VIN = VCC or GND, VOUT = 0.4V VCC = 4.5V, VIN = VCC or GND, VOUT = VCC -0 ...

Page 6

... Each pin except VCC and GND will have a resistor of 680 OPEN NOTE: Each pin except VCC and GND will have a resistor of 47K Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures. Specifications HCS157MS TABLE 6. APPLICABLE SUBGROUPS METHOD GROUP A SUBGROUPS 100%/5004 ...

Page 7

... Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test. • The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative. HCS157MS 100% Interim Electrical Test 1 (T1) 100% Delta Calculation (T0-T1) 100% Static Burn-In 2, Condition hrs ...

Page 8

... However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site http://www.intersil.com HCS157MS Transition Timing Diagram VOH ...

Page 9

... NOTE: The die diagram is a generic plot from a similar HCS device intended to indicate approximate die size and bond pad location. The mask series for the HCS157 is TA14371A. HCS157MS HCS157MS 181 (14) 4I0 (13) 4I1 (12) 4Y (11) 3I0 (10) 3I1 518833 ...

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