hcs195ms Intersil Corporation, hcs195ms Datasheet

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hcs195ms

Manufacturer Part Number
hcs195ms
Description
Radiation Hardened Inverting 8-bit Parallel-input/serial Output Shift Register
Manufacturer
Intersil Corporation
Datasheet
September 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Features
• 3 Micron Radiation Hardened CMOS SOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Latch-Up Free Under Any Conditions
• Fanout (Over Temperature Range)
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• Input Logic Levels
• Input Current Levels Ii
Description
The Intersil HCS195MS is a Radiation Hardened 8-Bit Paral-
lel-In/Serial-Out Shift Register with complementary serial
outputs and an asynchronous parallel load input.
The HCS195MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCS195MS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
HCS195DMSR
HCS195KMSR
HCS195D/Sample
HCS195K/Sample
HCS195HMSR
Bit-Day (Typ)
- Standard Outputs - 10 LSTTL Loads
- VIL = 0.3 VCC Max
- VIH = 0.7 VCC Min
PART NUMBER
10
RAD (Si)/s 20ns Pulse
5 A at VOL, VOH
TEMPERATURE RANGE
12
o
C to +125
RAD (Si)/s
-55
-55
o
o
C to +125
C to +125
+25
+25
+25
o
o
o
o
C
C
C
8-Bit Parallel-Input/Serial Output Shift Register
C
2
/mg
-9
o
o
C
C
Errors/
280
Pinouts
Intersil Class S Equivalent
Intersil Class S Equivalent
Sample
Sample
Die
GND
SCREENING LEVEL
MR
D0
D1
D2
D3
K
J
HCS195MS
MIL-STD-1835 CDFP4-F16, LEAD FINISH C
MIL-STD-1835 CDIP2-T16, LEAD FINISH C
FLATPACK PACKAGE (FLATPACK)
16 LEAD CERAMIC DUAL-IN-LINE
Radiation Hardened Inverting
16 LEAD CERAMIC METAL SEAL
METAL SEAL PACKAGE (SBDIP)
GND
MR
D0
D1
D2
D3
K
J
1
2
3
4
5
6
7
8
1
2
3
4
5
6
7
8
TOP VIEW
TOP VIEW
16 Lead SBDIP
16 Lead Ceramic Flatpack
16 Lead SBDIP
16 Lead Ceramic Flatpack
Die
16
15
14
13
12
11
10
9
16
15
14
13
12
11
10
Spec Number
9
File Number
PACKAGE
VCC
Q0
Q1
Q2
Q3
Q3
CP
PE
VCC
Q0
Q1
Q2
Q3
Q3
CP
PE
518760
3385.1

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hcs195ms Summary of contents

Page 1

... The HCS195MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. The HCS195MS is supplied lead Ceramic flatpack (K suffi SBDIP Package (D suffix). Ordering Information PART NUMBER ...

Page 2

... INPUTS referenced input (or output) one set-up time prior to clock level one set-up time prior to clock = positive clock HCS195MS TRUTH TABLE ...

Page 3

... VIL = 0.30(VCC), (Note 3) NOTES: 1. All voltages reference to device GND. 2. Force/measure functions may be interchanged. 3. For functional tests VO 4.0V is recognized as a logic “1”, and VO Specifications HCS195MS Reliability Information Thermal Resistance SBDIP Package 10mA Ceramic Flatpack Package . . . . . . . . . . . ...

Page 4

... The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics. Specifications HCS195MS GROUP (NOTES 1, 2) ...

Page 5

... AC measurements assume RL = 500 , CL = 50pF, Input 3ns, VIL = GND, VIH = VCC. 3. For functional tests VO 4.0V is recognized as a logic “1”, and VO TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25 PARAMETER ICC IOL/IOH Specifications HCS195MS (NOTES 1, 2) CONDITIONS TEMPERATURE 0.5V is recognized as a logic “0”. GROUP B SUBGROUP ...

Page 6

... Each pin except VCC and GND will have a resistor of 1k OPEN NOTE: Each pin except VCC and GND will have a resistor of 47K Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures. Specifications HCS195MS TABLE 6. APPLICABLE SUBGROUPS METHOD GROUP A SUBGROUPS 100%/5004 ...

Page 7

... However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see web site http://www.intersil.com HCS195MS 100% Interim Electrical Test 1 (T1) 100% Delta Calculation (T0-T1) 100% Static Burn-In 2, Condition hrs ...

Page 8

... INPUT VIH VIL TSU CP INPUT VIH VS VIL TH = Hold Time TSU = Setup Time TW = Pulse Width AC VOLTAGE LEVELS PARAMETER HCS VCC 4.50 VIH 4.50 VS 2.25 VIL 0 GND 0 HCS195MS AC Load Circuit TPHL TTHL 80% 20% UNITS Load Circuit TH TW UNITS 287 DUT TEST POINT ...

Page 9

... J (2) K (3) D0 (4) D1 (5) (6) D2 NOTE: The die diagram is a generic plot from a similar HCS device intended to indicate approximate die size and bond pad location. The mask series for the HCS195 is TA14387A. HCS195MS HCS195MS Q0 MR VCC (1) (16) (15) (7) (8) (9) GND ...

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