mc9s08qa4 Freescale Semiconductor, Inc, mc9s08qa4 Datasheet - Page 7

• Manufacturer Part Number: mc9s08qa4
• Description: Mc9s08qa4 8-bit Microcontrollers
• Manufacturer: Freescale Semiconductor, Inc

A device is defined as a failure if after exposure to ESD pulses the device no longer meets the device specification. Complete
DC parametric and functional testing is performed per the applicable device specification at room temperature followed by hot
temperature, unless specified otherwise in the device specification.
3.5
This section includes information about power supply requirements and I/O pin characteristics.
Freescale Semiconductor
Supply voltage (run, wait, and stop modes)
Minimum RAM retention supply voltage applied to V
Low-voltage detection threshold
Low-voltage warning threshold
DC Characteristics
1
Latch-up
Machine
Parameter is achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted.
Human
Model
Body
No.
1
2
3
4
Table 6. DC Characteristics (Temperature Range = –40 to 85°C Ambient)
Parameter
Series resistance
Storage capacitance
Number of pulses per pin
Series resistance
Storage capacitance
Number of pulses per pin
Minimum input voltage limit
Maximum input voltage limit
Human body model (HBM)
Machine model (MM)
Charge device model (CDM)
Latch-up current at T
Table 5. ESD and Latch-Up Protection Characteristics
Table 4. ESD and Latch-up Test Conditions
Description
Rating
1
A
MC9S08QA4 Series, Rev. 2
(V
(V
(V
= 85°C
(V
(V
DD
DD
DD
DD
DD
DD
falling)
falling)
falling)
rising)
rising)
Symbol
Symbol
Symbol
V
V
V
V
V
V
V
I
RAM
R1
R1
LVW
HBM
CDM
LAT
LVD
C
C
MM
DD
(rising)
V
±2000
V
±200
±500
±100
1.80
1.88
2.08
Min
Min
por
1.8
LVDL
1,2
Value
1500
–2.5
100
200
7.5
3
0
3
Typical
Max
1.82
1.90
2.1
—
—
—
—
—
—
—
Electrical Characteristics
Unit
Unit
mA
pF
pF
Ω
Ω
V
V
V
V
V
Max
1.91
1.99
3.6
3.6
2.2
—
Unit
V
V
V
V
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