km416v4100c Samsung Semiconductor, Inc., km416v4100c Datasheet - Page 8

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km416v4100c

Manufacturer Part Number
km416v4100c
Description
16bit Cmos Dynamic With Fast Page Mode
Manufacturer
Samsung Semiconductor, Inc.
Datasheet

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Part Number:
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KM416V4000C, KM416V4100C
NOTES
KM416V40(1)00C Truth Table
10.
11.
12.
RAS
1.
2.
3.
4.
5.
6.
7.
8.
9.
H
L
L
L
L
L
L
L
L
An initial pause of 200
achieved.
V
V
Measured with a load equivalent to 1 TTL load and 100pF.
Operation within the
If
Assumes that
t
or V
t
teristics only. If
duration of the cycle. If
and the data output will contain the data read from the selected address. If neither of the above conditions is satisfied, the
condition of the data out is indeterminate.
Either
These parameters are referenced to the CAS leading edge in early write cycles and to the W falling edge in read-modify-
write cycles.
Operation within the
t
These specifications are applied in the test mode.
In test mode read cycle, the value of
should be specified in test mode cycles by adding the above value to the specified value in this data sheet.
OFF
WCS
RAD
IH
IH
t
RCD
(min) and V
(min) and V
(min)and
ol
,
is greater than the specified
.
t
t
RWD
is greater than the specified
RCH
LCAS
,
or
H
H
H
X
L
L
L
L
L
t
CWD
t
t
t
OEZ
RRH
IL
RCD
IL
t
(max) and are assumed to be 5ns for all inputs.
(max) are reference levels for measuring timing of input signals. Transition times are measured between
WCS
and
(max) define the time at which the output achieves the open circuit condition and are not referenced V
must be satisfied for a read cycle.
t
t
RCD
t
RCD
RAD
§ Á
t
t
AWD
WCS
UCAS
t
(max).
CWD
(max) limit insures that
(max) limit insures that
is required after power-up followed by any 8 ROR or CBR cycles before proper device operation is
X
H
H
L
L
H
L
L
L
(min), the cycles is an early write cycle and the data output will remain high impedance for the
are non restrictive operating parameters. They are included in the data sheet as electric charac-
t
CWD
t
RAD
(min),
t
RCD
(max) limit, then access time is controlled by
t
RAC
(max) limit, then access time is controlled exclusively by
W
X
X
H
H
H
H
L
L
L
t
RWD
,
t
AA
,
t
t
RWD
t
t
RAC
CAC
RAC
(min) and
(max) can be met.
(max) can be met.
is delayed by 2ns to 5ns for the specified values. These parameters
OE
H
H
H
H
X
X
L
L
L
t
AWD
DQ0 - DQ7
DQ-OUT
DQ-OUT
t
DQ-IN
DQ-IN
AWD
Hi-Z
Hi-Z
Hi-Z
Hi-Z
t
RCD
-
t
RAD
(min), then the cycle is a read-modify-write cycle
(max) is specified as a reference point only.
(max) is specified as a reference point only. If
t
AA
.
DQ8-DQ15
DQ-OUT
DQ-OUT
DQ-IN
DQ-IN
Hi-Z
Hi-Z
Hi-Z
Hi-Z
-
t
CAC
.
CMOS DRAM
Word Read
Word Write
Byte Read
Byte Read
Byte Write
Byte Write
Standby
Refresh
STATE
-
oh

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