le79234-sw Zarlink Semiconductor, le79234-sw Datasheet - Page 16

• Manufacturer Part Number: le79234-sw
• Description: Voiceedgetm Control Processor Software Package Next Generation Carrier Chipset Ngcc
• Manufacturer: Zarlink Semiconductor

Calibration
Apply Calibration
Foreign DC Voltage Test
Foreign AC Voltage Test
DC Loop Resistance Test
Three-Element Insulation
Resistance Test
Four-Element Insulation
Resistance Test
Five-Element Insulation
Resistance Test
Algorithm Names
To measure correction factors that can be used to
improve measurement and DC feed accuracy. Factory
Calibration.
To measure correction factors that can be used to
improve measurement and DC feed accuracy. Factory
or In-Service Calibration.
To transfer the calibration factors into the SLAC in order
to improve the testing and DC feed accuracy.
To measure the DC foreign voltage present in the loop
while the line card is in a high impedance state. A low-
pass filter is used to filter out any AC voltage present on
the line.
To measure the AC foreign voltage present in the loop. A
high pass filter is used to filter out any DC voltage present
on the line.
To measure low loop impedance values generally less
than 4K Ohms using either Forward/Reverse Battery or
Offset Compensation algorithms.
To measure the resistances connected between Tip and
Ground, Ring and Ground, and Tip to Ring. The test can
also measure the foreign DC voltage and current. The
test can measure foreign voltage sources in excess of
the SLIC power supply rails.
To measure the resistances connected between Tip and
Ground, Ring and Ground, Tip to Ring, and Ring to Tip
using dual polarities for the metallic test signal.
To measure the resistances connected between Tip and
Ground, Ring and Ground, and Tip to Ring as well as
resistances between Tip and Battery and Ring and
battery.
Table 7 - NGVCP-NGCC Supported Line Test Packages
Description
Le79234-SW
Zarlink Semiconductor Inc.
VPTL_TID_CALIBRATE
VPTL_TID_APPLY_CALIBRATION
VPTL_TID_OPEN_DC_VOLTAGE
VPTL_TID_OPEN_AC_VOLTAGE
VPTL_TID_DC_LOOP_RES
VPTL_TID_3ELE_RES
VPTL_TID_4ELE_RES
VPTL_TID_5ELE_RES
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VP-Test Library Names
C
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Config.
D
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NT
NGVCP Packages
BT
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AT
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Data Sheet
ATP
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