le79234-sw Zarlink Semiconductor, le79234-sw Datasheet - Page 37

• Manufacturer Part Number: le79234-sw
• Description: Voiceedgetm Control Processor Software Package Next Generation Carrier Chipset Ngcc
• Manufacturer: Zarlink Semiconductor

2.6
Timing analysis has been performed in order to provide an estimate of the execution time for each test included in
the Line test library.
VPTL_TID_OPEN_DC_VOLTAGE
- Without auto disconnect
- No Active drive
VPTL_TID_OPEN_AC_VOLTAGE
VPTL_TID_FOREIGN_AC_CURRENT
VPTL_TID_MONITOR_IV
VPTL_TID_DC_LOOP_RES
VPTL_TID_DC_LOOP_RES_OFF_COMP
VPTL_TID_ROH
- With Receiver off-hook
- With short across TR
- With open circuit
VPTL_TID_REN
- Electronic (high cap = 2010 ms)
VPTL_TID_3ELE_RES (HIGH)
VPTL_TID_3ELE_RES (LOW)
VPTL_TID_4ELE_RES
VPTL_TID_5ELE_RES (HIGH)
VPTL_TID_5ELE_RES (LOW)
VPTL_TID_MSOCKET
VPTL_TID_3ELE_CAP (AC present or not)
- High cap 12 μF and induction
VPTL_TID_DISTANCE_TO_OPEN
VPTL_TID_FUSE_TEST
- Ringer present (phone on-hook)
- Open circuit (no phone present)
VPTL_TID_NOISE
- Others
VPTL_TID_TRANS_HYBRID_LOSS
VPTL_TID_SNR_QNTZ_DIST
VPTL_TID_RD_LOOP_BAT_COND_TEST
VPTL_TID_DC_FEED_SELF_TEST
- Active drive
- In disconnect for long
- Regular phone
- Low cap 10 nF (repeat in high gain)
- Mid cap 4 μF
- FILTER_15KHZ
Test Timing Analysis
Table 12
presents the supported line tests and their estimated execution time in milliseconds.
Test Measurement
Table 12 - Test Timing Analysis
Zarlink Semiconductor Inc.
Le79234-SW
37
Configuration C
Test Execution Time in mS
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Configuration D
Data Sheet