k4m56323lg Samsung Semiconductor, Inc., k4m56323lg Datasheet - Page 6
![no-image](/images/no-image-200.jpg)
k4m56323lg
Manufacturer Part Number
k4m56323lg
Description
2m X 32bit X 4 Banks Mobile Sdram In 90fbga
Manufacturer
Samsung Semiconductor, Inc.
Datasheet
1.K4M56323LG.pdf
(12 pages)
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
k4m56323lg-HN75
Manufacturer:
SAMSUNG
Quantity:
10 610
Company:
Part Number:
k4m56323lg-HN75
Manufacturer:
AGERE
Quantity:
110
Company:
Part Number:
k4m56323lg-HN75
Manufacturer:
SAMSUNG
Quantity:
4 000
Part Number:
k4m56323lg-HN75
Manufacturer:
SEC
Quantity:
20 000
K4M56323LG - F(H)N/G/L/F
AC OPERATING TEST CONDITIONS
Output
AC input levels (Vih/Vil)
Input timing measurement reference level
Input rise and fall time
Output timing measurement reference level
Output load condition
Figure 1. DC Output Load Circuit
500Ω
Parameter
VDDQ
500Ω
30pF
VOH (DC) = VDDQ - 0.2V, IOH = -0.1mA
VOL (DC) = 0.2V, IOL = 0.1mA
(V
DD
= 2.5V ± 0.2V, T
0.9 x V
Output
See Figure 2
0.5 x V
0.5 x V
tr/tf = 1/1
Value
A
= -25 to 85°C for Extended, -25 to 70°C for Commercial)
DDQ
Figure 2. AC Output Load Circuit
DDQ
DDQ
/ 0.2
Z0=50Ω
Mobile-SDRAM
Vtt=0.5 x VDDQ
50Ω
30pF
Unit
February 2006
ns
V
V
V