hcts20ms Intersil Corporation, hcts20ms Datasheet

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hcts20ms

Manufacturer Part Number
hcts20ms
Description
Rad-hard Dual 4-input Nand Gate
Manufacturer
Intersil Corporation
Datasheet
September 1995
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143
Copyright © Intersil Americas Inc. 2002. All Rights Reserved
Features
• 3 Micron Radiation Hardened SOS CMOS
• Total Dose 200K RAD (Si)
• SEP Effective LET No Upsets: >100 MEV-cm
• Single Event Upset (SEU) Immunity < 2 x 10
• Dose Rate Survivability: >1 x 10
• Dose Rate Upset >10
• Latch-Up Free Under Any Conditions
• Military Temperature Range: -55
• Significant Power Reduction Compared to LSTTL ICs
• DC Operating Voltage Range: 4.5V to 5.5V
• LSTTL Input Compatibility
• Input Current Levels Ii ≤ 5µA at VOL, VOH
Description
The Intersil HCTS20MS is a Radiation Hardened Dual 4-Input
NAND Gate. A low on any input forces the output to a High state.
The HCTS20MS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of radia-
tion hardened, high-speed, CMOS/SOS Logic Family.
The HCTS20MS is supplied in a 14 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
Ordering Information
HCTS20DMSR
HCTS20KMSR
HCTS20D/
Sample
HCTS20K/
Sample
HCTS20HMSR
(Typ)
- VIL = 0.8V Max
- VIH = VCC/2 Min
NUMBER
PART
TEMPERATURE
-55
-55
o
o
RANGE
C to +125
C to +125
+25
+25
+25
|
Intersil (and design) is a trademark of Intersil Americas Inc.
TM
10
o
o
o
C
C
C
RAD (Si)/s 20ns Pulse
o
o
C
C
Intersil Class
S Equivalent
Intersil Class
S Equivalent
Sample
Sample
Die
SCREENING
12
o
LEVEL
C to +125
RAD (Si)/s
o
-9
C
14 Lead SBDIP
14 Lead Ceramic
Flatpack
14 Lead SBDIP
14 Lead Ceramic
Flatpack
Die
2
/mg
Errors/Bit-Day
PACKAGE
420
Pinouts
Functional Diagram
NOTE: L = Logic Level Low, H = Logic level High, X = Don’t Care
14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE
HCTS20MS
GND
An
Bn
Cn
Dn
NC
A1
B1
C1
D1
Y1
An
H
L
X
X
X
14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL
PACKAGE (SBDIP) MIL-STD-183S CDIP2-T14
(FLATPACK) MIL-STD-183S CDFP3-F14
Bn
H
X
X
X
GND
L
NC
INPUTS
A1
B1
C1
D1
Y1
Dual 4-Input NAND Gate
1
2
3
4
5
6
7
TRUTH TABLE
1
2
3
4
5
6
7
Cn
X
X
X
H
L
TOP VIEW
TOP VIEW
Radiation Hardened
Dn
X
X
X
H
L
Spec Number
14
13
12
11
10
9
8
14
13
12
10
11
9
8
VCC
D2
C2
NC
B2
A2
Y2
OUTPUTS
Yn
FN3051.1
H
H
H
H
L
518619
VCC
D2
C2
NC
B2
A2
Y2
Yn

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hcts20ms Summary of contents

Page 1

... NAND Gate. A low on any input forces the output to a High state. The HCTS20MS utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radia- tion hardened, high-speed, CMOS/SOS Logic Family. The HCTS20MS is supplied lead Ceramic flatpack (K suffix SBDIP Package (D suffix). Ordering Information PART ...

Page 2

... VIL = 0.80V (Note 2) NOTES: 1. All voltages reference to device GND. 2. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”. Specifications HCTS20MS Reliability Information Thermal Resistance SBDIP Package ...

Page 3

... NOTES: 1. All voltages referenced to device GND measurements assume RL = 500Ω 50pF, Input 3ns, VIL = GND, VIH = 3V. 3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”. Specifications HCTS20MS GROUP (NOTES SUB- ...

Page 4

... Group D NOTE: 1. Alternate group A inspection in accordance with Method 5005 of MIL-STD-883 may be exercised. CONFORMANCE GROUPS METHOD Group E Subgroup 2 5005 NOTE: 1. Except FN test which will be performed 100% Go/No-Go. Specifications HCTS20MS GROUP B SUBGROUP DELTA LIMIT 5 5 -15 Hour TABLE 6. APPLICABLE SUBGROUPS METHOD GROUP A SUBGROUPS 100%/5004 ...

Page 5

... Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in OPEN NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing. Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures. Specifications HCTS20MS 1/2 VCC = 3V ± 0.5V VCC = 6V ± 0. ...

Page 6

... Variables Data (All Delta operations). Data is identified by serial number. Data header includes lot number and date of test. • The Certificate of Conformance is a part of the shipping invoice and is not part of the Data Book. The Certificate of Conformance is signed by an authorized Quality Representative. HCTS20MS 100% Interim Electrical Test 1 (T1) 100% Delta Calculation (T0-T1) 100% Static Burn-In 2, Condition hrs ...

Page 7

... However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com HCTS20MS AC Load Circuit DUT ...

Page 8

... Metallization Mask Layout B1 (2) NC (3) C1 (4) D1 (5) NOTE: The die diagram is a generic plot from a similar HCS device intended to indicate approximate die size and bond pad location. The mask series for the HCTS20 is TA14426A. HCTS20MS HCTS20MS A1 VCC D2 (1) (14) (13) (6) (7) ...

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